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74F257A Datasheet(PDF) 5 Page - NXP Semiconductors

Part No. 74F257A
Description  Quad 2-line to 1-line selector/multiplexer, non-inverting 3-State
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Manufacturer  PHILIPS [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

74F257A Datasheet(HTML) 5 Page - NXP Semiconductors

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Philips Semiconductors
Product specification
74F257A
Quad 2-line to 1-line selector/multiplexer, non-inverting
(3-State)
1995 Mar 31
5
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS1
MIN
TYP2
MAX
UNIT
VO
High level output voltage
VCC = MIN, VIL = MAX,
±10%V
CC
2.4
V
VOH
High-level output voltage
CC
,
IL
,
VIH = MIN, IOH = MAX
±5%V
CC
2.7
3.3
V
VO
Low level output voltage
VCC = MIN, VIL = MAX,
±10%V
CC
0.35
0.50
V
VOL
Low-level output voltage
CC
,
IL
,
VIH = MIN, IOL = MAX
±5%V
CC
0.35
0.50
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
II
Input current at maximum input voltage
VCC = MAX, VI = 7.0V
100
µA
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
µA
IIL
Low-level input current
VCC = MAX, VI = 0.5V
–0.6
mA
IOZH
Off state output current,
High-level voltage applied
VCC = MAX, VO = 2.7V
50
µA
IOZL
Off state output current,
Low-level voltage applied
VCC = MAX, VO = 0.5V
–50
µA
IOS
Short-circuit output current3
VCC = MAX
-60
–150
mA
4
ICCH
9.0
15.0
mA
ICC
Supply current4 (total)
ICCL
VCC = MAX
14.5
22.0
mA
ICCZ
15.0
23.0
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
4. Measure ICC with all outputs open and inputs grounded.
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST
CONDITION
Tamb = +25°C
VCC = +5.0V
CL = 50pF
RL = 500Ω
Tamb = 0°C to +70°C
VCC = +5.0V ± 10%
CL = 50pF
RL = 500Ω
Tamb = –40°C to +85°C
VCC = +5.0V ± 10%
CL = 50pF
RL = 500Ω
UNIT
MIN
TYP
MAX
MIN
MAX
MIN
MAX
tPLH
tPHL
Propagation delay
In to Yn
Waveform 1
3.0
2.0
4.5
3.5
6.0
5.0
3.0
2.0
7.0
6.0
3.0
2.0
7.0
7.0
ns
tPLH
tPHL
Propagation delay
S to Yn
Waveform 1
5.0
4.0
7.5
5.5
9.5
7.0
5.0
4.0
10.5
8.0
5.0
4.0
10.5
8.5
ns
tPZH
tPZL
Output Enable time
to High or Low level
Waveform 2
Waveform 3
4.5
4.5
6.5
6.0
7.5
7.5
4.5
4.5
8.5
8.5
4.5
4.5
8.5
8.5
ns
tPHZ
tPLZ
Output Disable time
from High or Low level
Waveform 2
Waveform 3
2.0
2.0
4.0
3.5
5.5
5.5
2.0
2.0
6.0
6.0
2.0
2.0
6.0
6.0
ns


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