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N74F199N Datasheet(PDF) 5 Page - NXP Semiconductors |
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N74F199N Datasheet(HTML) 5 Page - NXP Semiconductors |
5 / 8 page Philips Semiconductors FAST Products Product specification 74F199 8-bit parallel-access shift register June 15, 1988 5 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX UNIT VOH High-level output voltage VCC = MIN, VIL = MAX ±10%VCC 2.5 V VOH High-level output voltage VIH = MIN, IOH = MAX ±5%VCC 2.7 3.4 V VOL Low-level output voltage VCC = MIN, VIL = MAX ±10%VCC 0.35 0.50 V VOL Low-level output voltage VIH = MIN, IOL = MAX ±5%VCC 0.35 0.50 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage VCC = MAX, VI = 7.0V 100 µA IIH High-level input current VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current VCC = MAX, VI = 0.5V –0.6 mA IOS Short-circuit output current3 VCC = MAX –60 –150 mA ICC Supply current (total) ICCH VCC = MAX 65 90 mA ICC Supply current (total) ICCL VCC = MAX 75 105 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. |
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