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N74F112D Datasheet(PDF) 4 Page - NXP Semiconductors |
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N74F112D Datasheet(HTML) 4 Page - NXP Semiconductors |
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4 / 10 page  Philips Semiconductors Product specification 74F112 Dual J-K negative edge-triggered flip-flop February 9, 1990 4 ABSOLUTE MAXIMUM RATINGS (Operation beyond the limits set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the operating free-air temperature range.) SYMBOL PARAMETER RATING UNIT VCC Supply voltage –0.5 to +7.0 V VIN Input voltage –0.5 to +7.0 V IIN Input current –30 to +5 mA VOUT Voltage applied to output in High output state –0.5 to VCC V IOUT Current applied to output in Low output state 40 mA T Operating free air temperature range Commercial range 0 to +70 °C Tamb Operating free-air temperature range Industrial range –40 to +85 °C Tstg Storage temperature range –65 to +150 °C RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER LIMITS UNIT SYMBOL PARAMETER MIN NOM MAX UNIT VCC Supply voltage 4.5 5.0 5.5 V VIH High-level input voltage 2.0 V VIL Low-level input voltage 0.8 V IIK Input clamp current –18 mA IOH High-level output current –1 mA IOL Low-level output current 20 mA T Operating free air temperature range Commercial range 0 +70 °C Tamb Operating free-air temperature range Industrial range –40 +85 °C DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX UNIT VO High level output voltage VCC = MIN, VIL = MAX ±10%VCC 2.5 V VOH High-level output voltage VIH = MIN, IOH = MAX ±5%VCC 2.7 3.4 V VO Low level output voltage VCC = MIN, VIL = MAX ±10%VCC 0.35 0.50 V VOL Low-level output voltage VIH = MIN, IOL = MAX ±5%VCC 0.35 0.50 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage VCC = MAX, VI = 7.0V 100 µA IIH High-level input current VCC = MAX, VI = 2.7V 20 µA Jn, Kn –0.6 mA IIL Low-level input current CPn VCC = MAX, VI = 0.5V –2.4 mA SDn, RDn –3.0 mA IOS Short-circuit output current3 VCC = MAX –60 –150 mA ICC Supply current (total)4 VCC = MAX 15 21 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. 4. Measure ICC with the clock input grounded and all outputs open, with the Q and Q outputs High in turn. |
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