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74ALS00A Datasheet(PDF) 4 Page - NXP Semiconductors

Part No. 74ALS00A
Description  Quad 2-Input NAND gate
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Maker  PHILIPS [NXP Semiconductors]
Homepage  http://www.nxp.com
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 4 page
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Philips Semiconductors
Product specification
74ALS00A
Quad 2-input NAND gate
1991 Feb 08
4
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST CONDITION
Tamb = 0°C to +70°C
VCC = +5.0V ± 10%
CL = 50pF, RL = 500Ω
UNIT
MIN
MAX
tPLH
tPHL
Propagation delay
nA, nB to nY
Waveform 1
2.0
2.0
11.0
8.0
ns
AC WAVEFORMS
For all waveforms, VM = 1.3V.
VM
VM
VM
VM
tPLH
tPHL
nA, nB
nY
SC00004
Waveform 1.
Propagation Delay for Data to Output
TEST CIRCUIT AND WAVEFORMS
tw
90%
VM
10%
90%
VM
10%
90%
VM
10%
90%
VM
10%
NEGATIVE
PULSE
POSITIVE
PULSE
tw
AMP (V)
0.3V
0.3V
tTHL (tff)
INPUT PULSE REQUIREMENTS
Rep.Rate
tw
tTLH
tTHL
1MHz
500ns
2.0ns
2.0ns
Input Pulse Definition
VCC
Family
74ALS
D.U.T.
PULSE
GENERATOR
RL
CL
RT
VIN
VOUT
Test Circuit for Totem-pole Outputs
DEFINITIONS:
RL = Load resistor;
see AC electrical characteristics for value.
CL = Load capacitance includes jig and probe capacitance;
see AC electrical characteristics for value.
RT = Termination resistance should be equal to ZOUT of
pulse generators.
tTHL (tf )
tTLH (tr )
tTLH (tr )
AMP (V)
Amplitude
3.5V
1.3V
VM
SC00005




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