Philips Semiconductors

Product specification

74ABT646A

Octal bus transceiver/register (3-State)

1998 Feb 17

6

DC ELECTRICAL CHARACTERISTICS

LIMITS

SYMBOL

PARAMETER

TEST CONDITIONS

to +85

°C

UNIT

Min

Typ

Max

Min

Max

Input clamp voltage

–0.9

–1.2

–1.2

V

2.5

3.0

2.5

V

High–level output voltage

3.0

3.5

3.0

V

2.0

2.4

2.0

V

Low–level output voltage

0.3

0.55

0.55

V

Power-up output low

0.13

0.55

0.55

V

I

Input leakage

Control pins

±0.01

±1.0

±1.0

µA

current

Data pins

±5

±100

±100

µA

Power-off leakage current

±5.0

±100

±100

µA

Power-up/down 3-State

±5.0

±50

±50

µA

3–State output High current

5.0

50

50

µA

3–State output Low current

–5.0

–50

–50

µA

Output High leakage current

5.0

50

50

µA

–40

–65

–180

–40

–180

mA

110

250

250

µA

Quiescent supply current

20

30

30

mA

Quiescent su

ly current

110

250

250

µA

Additional supply current per

0.6

1.5

1.5

mA

NOTES:

1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.

2. This is the increase in supply current for each input at 3.4V.

3. For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power.

transition time of up to 100

µsec is permitted.

5. This data sheet limit may vary among suppliers.