Philips Semiconductors

Product specification

74ABT02

Quad 2-input NOR gate

1995 Sep 18

3

SYMBOL

PARAMETER

CONDITIONS

RATING

UNIT

DC supply voltage

–0.5 to +7.0

V

DC input diode current

–18

mA

–1.2 to +7.0

V

DC output diode current

–50

mA

output in Off or High state

–0.5 to +5.5

V

DC output current

output in Low state

40

mA

Storage temperature range

–65 to 150

°C

NOTES:

1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the

device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to

absolute-maximum-rated conditions for extended periods may affect device reliability.

2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction

temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150

°C.

3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.

RECOMMENDED OPERATING CONDITIONS

SYMBOL

PARAMETER

LIMITS

UNIT

SYMBOL

PARAMETER

MIN

MAX

UNIT

DC supply voltage

4.5

5.5

V

Input voltage

0

V

High-level input voltage

2.0

V

Low-level input voltage

0.8

V

High-level output current

–15

mA

Low-level output current

20

mA

∆t/∆v

Input transition rise or fall rate

0

5

ns/V

Operating free-air temperature range

–40

+85

°C

DC ELECTRICAL CHARACTERISTICS

LIMITS

SYMBOL

PARAMETER

TEST CONDITIONS

to +85

°C

UNIT

MIN

TYP

MAX

MIN

MAX

Input clamp voltage

–0.9

–1.2

–1.2

V

High-level output voltage

2.5

2.9

2.5

V

Low-level output voltage

0.35

0.5

0.5

V

Input leakage current

±0.01

±1.0

±1.0

µA

Power-off leakage current

±5.0

±100

±100

µA

Output High leakage current

5.0

50

50

µA

–50

–75

–180

–50

–180

mA

Quiescent supply current

2

50

50

µA

Additional supply current per

0.25

500

500

µA

NOTES:

1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.

2. This is the increase in supply current for each input at 3.4V.