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CPC5601 Datasheet(PDF) 3 Page - Clare, Inc. |
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CPC5601 Datasheet(HTML) 3 Page - Clare, Inc. |
3 / 14 page CPC5601 R3.0 www.clare.com 3 1. Specifications 1.1 Absolute Minimum and Maximum Ratings 1.2 Electrical Characteristics Parameter Minimum Maximum Unit Conditions Isolation Voltage 1500 - VRMS From pins 1, 2, and 3 to pins 7 through 16 Operating temperature 0 +85 °C Storage temperature -40 +125 °C Soldering temperature - +220 °C Parameter Minimum Typical Maximum Unit Conditions Data Input Input high threshold current - 1 5 mA Input low threshold current 0.10 0.20 - mA Input voltage drop 0.9 1.2 1.4 V IF = 5 mA b1 Through b5 Output Driver Output Current - - 10 mA Output Breakdown Voltage - - 6 V On Resistance - 10 11 Ω Supply voltage >= 2.8 V b6 Output Driver Output Current - - 120 mA Output Breakdown Voltage - - 6 V On Resistance - 0.5 1.4 Ω Supply voltage >= 2.8 V Ring Detect Input Input Control Current 6 20 100 mA IC = 2 mA, VCE = 0.5 V Input Voltage drop 0.9 1.2 1.4 V IF = 5 mA Ring Detect Output Blocking Voltage 20 50 - V IC = 10 mA Dark Current - 50 500 nA IF = 0 mA Saturation Voltage - 0.3 0.5 V IC = 2 mA, IF = 16 mA Current transfer ratio 33 400 - % IF = 6 mA, VCE = 0.5 V Power Requirements Supply Voltage 2.5 3.5 5.5 V Total supply current (input current low) - 0.01 1 µA Total supply current (input current high) - 10 20 µA Specifications subject to change without notice. All performance characteristics based on the use of Clare, Inc. application circuits. Functional operation of the device at conditions beyond those specified here is not implied. Specification conditions: VDD = 5V, temperature = 25 °C, unless otherwise indi- cated. Absolute maximum ratings are stress rat- ings. Stresses in excess of these ratings can cause permanent damage to the device. Functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this data sheet is not implied. Exposure of the device to the absolute maximum rat- ings for an extended period may degrade the device and affect its reliability. |
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