HY62KF08401C-I datasheet(5/10 Pages) HYNIX

Part #	HY62KF08401C-I

Description	512Kx8bit full CMOS SRAM

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Manufacturer	HYNIX [Hynix Semiconductor]

Direct Link	http://www.skhynix.com/kor/main.do

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HY62KF08401C Series

Rev.01 / Jun.01

4

AC CHARACTERISTICS

TA = -40

°C to 85°C, unless otherwise specified

55ns

70ns

#

Symbol

Parameter

Min.

Max.

Min.

Max.

Unit

1

tRC

Read Cycle Time

55

-

70

-

ns

2

tAA

Address Access Time

-

55

-

70

ns

3

tACS

Chip Select Access Time

-

55

-

70

ns

4

tOE

Output Enable to Output Valid

-

30

-

35

ns

5

tCLZ

Chip Select to Output in Low Z

10

-

10

-

ns

6

tOLZ

Output Enable to Output in Low Z

5

-

5

-

ns

7

tCHZ

Chip Deselection to Output in High Z

0

30

0

30

ns

8

tOHZ

Out Disable to Output in High Z

0

30

0

30

ns

9

tOH

Output Hold from Address Change

10

-

10

-

ns

10

tWC

Write Cycle Time

55

-

70

-

ns

11

tCW

Chip Selection to End of Write

50

-

60

-

ns

12

tAW

Address Valid to End of Write

50

-

60

-

ns

13

tAS

Address Set-up Time

0

-

0

-

ns

14

tWP

Write Pulse Width

45

-

50

-

ns

15

tWR

Write Recovery Time

0

-

0

-

ns

16

tWHZ

Write to Output in High Z

0

20

0

20

ns

17

tDW

Data to Write Time Overlap

25

-

30

-

ns

18

tDH

Data Hold from Write Time

0

-

0

-

ns

19

tOW

Output Active from End of Write

5

-

5

-

ns

AC TEST CONDITIONS

TA = -40

°C to 85°C, unless otherwise specified

Parameter

Value

Input Pulse Level

0.4V to 2.2V

Input Rise and Fall Time

5ns

Input and Output Timing Reference Level

1.5V

tCLZ, tOLZ, tCHZ, tOHZ, tWHZ, tOW

CL = 5pF + 1TTL Load

Output Load

Others

CL = 30pF + 1TTL Load

AC TEST LOADS

D

OUT

1728 Ohm

CL(1)

1029 Ohm

V

TM=2.8V

Note

1. Including jig and scope capacitance

READ CYCLE

WRITE CYCLE

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