2

PS2013A 03/09/96

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PI74FCT273T

(25

Ω

Ω

Ω

Ω

Ω Series) P174FCT2273T

Octal D Flip-Flop with Master Reset

Storage Temperature ............................................................ –65°C to +150°C

Ambient Temperature with Power Applied ............................ -40°C to +85°C

Supply Voltage to Ground Potential (Inputs & Vcc Only) ..... –0.5V to +7.0V

Supply Voltage to Ground Potential (Outputs & D/O Only) .. –0.5V to +7.0V

DC Input Voltage .................................................................... –0.5V to +7.0V

DC Output Current .............................................................................. 120 mA

Power Dissipation ..................................................................................... 0.5W

Note:

Stresses greater than those listed under MAXIMUM

RATINGS may cause permanent damage to the

device. This is a stress rating only and functional

operation of the device at these or any other condi-

tions above those indicated in the operational sec-

tions of this specification is not implied. Exposure

to absolute maximum rating conditions for extended

periods may affect reliability.

Parameters Description

Test Conditions

(1)

Min. Typ

(2)

Max. Units

Output HIGH Voltage

2.4

3.0

V

Output LOW Current

0.3

0.55

V

Output LOW Current

Ω Series)

0.3

0.50

V

Input HIGH Voltage

Guaranteed Logic HIGH Level

2.0

V

Input LOW Voltage

Guaranteed Logic LOW Level

0.8

V

Input HIGH Current

1µA

Input LOW Current

–1

µA

High Impedance

1

µA

Output Current

–1

µA

Clamp Diode Voltage

–0.7

–1.2

V

Power Down Disable

—

—

100

µA

Short Circuit Current

–60

–120

mA

Input Hysteresis

200

mV

Parameters

(4)

Description

Test Conditions

Typ

Max.

Units

Input Capacitance

6

10

pF

Output Capacitance

8

12

pF

Notes:

1. For Max. or Min. conditions, use appropriate value specified under Electrical Characteristics for the applicable device type.

2. Typical values are at Vcc = 5.0V, +25°C ambient and maximum loading.

3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.

4. This parameter is determined by device characterization but is not production tested.

Maximum Ratings

(Above which the useful life may be impaired. For user guidelines, not tested.)