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ADM6821 Datasheet(PDF) 3 Page - Analog Devices

Part No. ADM6821
Description  Low Voltage Supervisory Circuits with Watchdog & Manual Reset in 5-Lead SOT-23
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Maker  AD [Analog Devices]
Homepage  http://www.analog.com
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ADM6821 Datasheet(HTML) 3 Page - Analog Devices

   
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Preliminary Technical Data
ADM6821–ADM6825
Rev.PrA | Page 3 of 7
Parameter
Min
Typ
Max
Units
Test Conditions/Comments
0.8
×VCC
V
VCC>=3.15V, ISOURCE=500uA,
reset not asserted
0.8
×VCC
V
VCC>=1.8V, ISOURCE=200uA,
reset not asserted
RESET Output Voltage High
0.8
×VCC
VCC>=4.25V, ISOURCE=800uA,
reset asserted
0.8
×VCC
VCC>=2.55V, ISOURCE=500uA,
reset asserted
0.8
×VCC
VCC>=1.50V, ISOURCE=100uA,
reset asserted
0.8
×VCC
VCC>=1.0V, ISOURCE=1uA,
reset asserted, TA=-40°C to +85°C
RESET Output Voltage Low
0.4
V
VCC>=4.75V, ISINK=3.2mA,
reset not asserted
0.3
V
VCC>=3.15V, ISINK=1.2mA,
reset not asserted
0.3
V
VCC>=1.8V, ISINK=500uA,
reset not asserted
WATCHDOG INPUT (ADM6821-ADM6824)
Watchdog Timeout Period
1.12
1.6
2.40
s
WDI Pulse Width
50
ns
VIL=0.4V, VIH=0.8
×VCC,
WDI Input Threshold
VIL
0.3xVCC
V
VIH
0.7xVCC
V
WDI Input Current
120
160
µA
VWDI= VCC, time average
-20
-15
µA
VWDI=0, time average
MANUAL RESET INPUT (ADM6821-ADM6823/ADM6825)
MR Input Threshold
0.3xVCC
V
0.7xVCC
V
MR Input Pulse Width
1
µs
MR Glitch Rejection
100
ns
MR Pull-up Resistance
25
50
75
k
MR to Reset Delay
200
ns
ABSOLUTE MAXIMUM RATINGS
Table 3. TA = 25°C unless otherwise noted.
Parameter
Rating
VCC
-0.3V to +6V
Output Current (RESET, RESET)
20mA
Operating Temperature Range
-40°C to +125°C
Storage Temperature Range
-65°C to +150°C
θJA Thermal Impedance
270°C/W
Lead Temperature
Soldering (10 sec)
300°C
Vapour Phase (60 sec)
215°C
Infrared (15 sec)
220°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or
any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.


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