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TMPA2156D2 Datasheet(PDF) 2 Page - List of Unclassifed Manufacturers

Part No. TMPA2156D2
Description  0.73W/CH STEREO CLASS-D AUDIO POWER AMPLIFIER
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Maker  ETC1 [List of Unclassifed Manufacturers]
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TMPA2156D2 Datasheet(HTML) 2 Page - List of Unclassifed Manufacturers

 
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Tai-1 Microelectronics
Preliminary
TMPA2156D2
www.taimec.com.tw
Rev.1.0
September 7, 2005
Copyright
©2005, Tai-1 Microelectronics Corp.
2
TOP VIEW
(Please email david@taimec.com.tw for complete datasheet.)
Tai-1 Microelectronics reserves the right to make corrections, modifications, enhancements, improvements, and other changes
to its products and services at any time and to discontinue any product or service without notice. Customers are responsible
for their products and applications using Tai-1 Microelectronics components.
Note that the external components or PCB layout should be designed not to generate abnormal
voltages to the chip to prevent from latch up which may cause damage to the device.
Typical Application
S1
switch
C7
10uF
L1
33uH
1
8
2
7
3
6
4
5
VO1
GND
IN1
IN2
Vo2
VDD
VDDA
SDNB
JP1
2156D2
L2
33uH
VI2
VI1
SDNB
R4
22k
R5
22k
VDD
VO1
VO2
R2
100
J1
PHONEJACKSTEREO
R6
100K
C1
0.47uF
C2
0.47uF
C4
1uF
R3
100
C3
1uF
VDDA
VDD
VDD
R7
3k
R8
3k
R13
3k
R9
3k
C8
1000uF
C9
1000uF
C5
1uF
C6
1uF
R1
100
C10
100uF
+
+
+
ABSOLUTE MAXIMUM RATINGS
Over operating free-air temperature range unless otherwise noted(1)
In normal mode
-0.3V to 6V
V
Supply voltage, VDD
In shutdown mode
-0.3V to 7V
V
Input voltage, VI
-0.3V to VDD+0.3V
V
Continuous total power dissipation
See package dissipation ratings
Operating free-air temperature, TA
-20 to 85
。C
Operating junction temperature, TJ
-20 to 150
。C
Storage temperature, Tstg
-40 to 150
。C
(1) Stresses beyond those listed under
”absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only,
and functional operation of the device at these or any other conditions beyond those indicated under
“recommended operating conditions “is
not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
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