Stock No. 23206-01 11/01/02

5

The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.

NanoAmp Solutions, Inc.

N01M083WL1A

Timing Test Conditions

Item

Input Pulse Level

Input Rise and Fall Time

5ns

Input and Output Timing Reference Levels

Output Load

CL = 30pF

Operating Temperature

Timing

Item

Symbol

2.3 - 3.6 V

2.7 - 3.6 V

Units

Min.

Max.

Min.

Max.

Read Cycle Time

100

70

ns

Address Access Time

100

70

ns

Chip Enable to Valid Output

100

70

ns

Output Enable to Valid Output

35

35

ns

Chip Enable to Low-Z output

15

10

ns

Output Enable to Low-Z Output

10

5

ns

Chip Disable to High-Z Output

0300

20

ns

Output Disable to High-Z Output

0300

20

ns

Output Hold from Address Change

15

10

ns

Write Cycle Time

100

70

ns

Chip Enable to End of Write

70

50

ns

Address Valid to End of Write

70

50

ns

Write Pulse Width

50

40

ns

Address Setup Time

00

ns

Write Recovery Time

00

ns

Write to High-Z Output

30

20

ns

Data to Write Time Overlap

50

40

ns

Data Hold from Write Time

00

ns

End Write to Low-Z Output

10

5

ns