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LM5025BSD Datasheet(PDF) 7 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part # LM5025BSD
Description  Active Clamp Voltage Mode PWM Controller
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

LM5025BSD Datasheet(HTML) 7 Page - National Semiconductor (TI)

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Electrical Characteristics (Continued)
Specifications with standard typeface are for T
J = 25˚C, and those with boldface type apply over full Operating Junction
Temperature range.V
IN = 48V, VCC = 10V, RT = 26.7k
Ω,R
SET = 27.4k
Ω) unless otherwise stated (Note 3)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
OUT_B High
Saturation
MOS Device @ Iout =
-10mA,
10
20
OUTPUT_B Peak
Current Sink
Bipolar Device @ Vcc/2
1
A
OUT_B Low
Saturation
MOS Device @ Iout =
10mA,
12
18
OUTPUT_B Rise Time
C
gate = 1nF
20
ns
OUTPUT_B Fall Time
C
gate = 1nF
15
ns
Output Timing Control
Overlap Time
R
SET =38k
Ω connected to
GND, 50% to 50%
transitions
75
105
135
ns
Deadtime
R
SET = 29.5 k
Ω connected
to REF, 50% to 50%
transitions
75
105
135
ns
Thermal Shutdown
T
SD
Thermal Shutdown
Threshold
165
˚C
Thermal Shutdown
Hysteresis
25
˚C
Thermal Resistance
θ
JA
Junction to Ambient
MTC Package
125
˚C/W
SDA Package
32
˚C/W
θ
JC
Junction to Case
MTC Package
30
˚C/W
SDA Package
5
˚C/W
Note 1: Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions under which operation of the device
is intended to be functional. For guaranteed specifications and test conditions, see the Electrical Characteristics.
Note 2: For detailed information on soldering plastic TSSOP and LLP packages, refer to the Packaging Data Book available from National Semiconductor
Corporation.
Note 3: All limits are guaranteed. All electrical characteristics having room temperature limits are tested during production with TA =TJ = 25˚C. All hot and cold limits
are guaranteed by correlating the electrical characteristics to process and temperature variations and applying statistical process control.
Note 4: Device thermal limitations may limit usable range.
www.national.com
7


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