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AT77C102B Datasheet(PDF) 6 Page - ATMEL Corporation |
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AT77C102B Datasheet(HTML) 6 Page - ATMEL Corporation |
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6 5364A–BIOM–09/05 AT77C102B Table 3-3. Resistance Parameter Min Value Standard Method ESD On pins. HBM (Human Body Model) CMOS I/O 2 kV MIL-STD-883 - method 3015.7 On die surface (Zapgun) Air discharge ±16 kV NF EN 6100-4-2 Mechanical Abrasion Number of cycles without lubricant multiply by an estimated factor of 20 for correlation with a real finger 200 000 MIL E 12397B Chemical Resistance Cleaning agent, acid, grease, alcohol, diluted acetone 4 hours Internal method Table 3-4. Specifications Explanation Of Test Levels I 100% production tested at +25°C II 100% production tested at +25°C, and sample tested at specified temperatures (AC testing done on sample) III Sample tested only IV Parameter is guaranteed by design and/or characterization testing V Parameter is a typical value only VI 100% production tested at temperature extremes D 100% probe tested on wafer at Tamb = +25°C Table 3-5. Physical Parameter Parameter Test Level Min Typ Max Unit Resolution IV 50 µm Size IV 8 x 280 Pixel Yield: number of bad pixels I 5 Bad pixels Equivalent resistance on TPP pin I 20 30 47 Ω |
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