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MAX1197 Datasheet(PDF) 13 Page - Maxim Integrated Products |
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MAX1197 Datasheet(HTML) 13 Page - Maxim Integrated Products |
13 / 22 page Match the impedance of INA+ and INA-, as well as INB+ and INB-, and set the common-mode voltage to mid-supply (VDD/2) for optimum performance. Analog Inputs and Reference Configurations The full-scale range of the MAX1197 is determined by the internally generated voltage difference between REFP (VDD/2 + VREFIN/4) and REFN (VDD/2 - VREFIN/4). The full-scale range for both on-chip ADCs is adjustable through the REFIN pin, which is provided for this purpose. The MAX1197 provides three modes of reference oper- ation: • Internal reference mode • Buffered external reference mode • Unbuffered external reference mode In internal reference mode, connect the internal refer- ence output REFOUT to REFIN through a resistor (e.g., 10k Ω) or resistor divider, if an application requires a reduced full-scale range. For stability and noise-filtering purposes, bypass REFIN with a >10nF capacitor to GND. In internal reference mode, REFOUT, COM, REFP, and REFN become low-impedance outputs. In buffered external reference mode, adjust the refer- ence voltage levels externally by applying a stable and accurate voltage at REFIN. In this mode, COM, REFP, and REFN are outputs. REFOUT can be left open or connected to REFIN through a >10k Ω resistor. In unbuffered external reference mode, connect REFIN to GND. This deactivates the on-chip reference buffers for REFP, COM, and REFN. With their buffers shut down, these nodes become high-impedance inputs and can be driven through separate, external reference sources. For detailed circuit suggestions and how to drive this dual ADC in buffered/unbuffered external reference mode, see the Applications Information section. Clock Input (CLK) The MAX1197’s CLK input accepts a CMOS-compati- ble clock signal. Since the interstage conversion of the device depends on the repeatability of the rising and falling edges of the external clock, use a clock with low jitter and fast rise and fall times (<2ns). In particular, sampling occurs on the rising edge of the clock signal, requiring this edge to provide lowest possible jitter. Any significant aperture jitter would limit the SNR perfor- mance of the on-chip ADCs as follows: Dual, 8-Bit, 60Msps, 3V, Low-Power ADC with Internal Reference and Parallel Outputs ______________________________________________________________________________________ 13 N - 6 N N - 5 N + 1 N - 4 N + 2 N - 3 N + 3 N - 2 N + 4 N - 1 N + 5 N N + 6 N + 1 5-CLOCK-CYCLE LATENCY ANALOG INPUT CLOCK INPUT DATA OUTPUT D7A–D0A tDO tCH tCL N - 6 N - 5 N - 4 N - 3 N - 2 N - 1 N N + 1 DATA OUTPUT D7B–D0B tAD Figure 3. System Timing Diagram |
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