IS27HC010

8

Integrated Silicon Solution, Inc.

EP009-1F

07/18/97

°C ± 5°C)

Symbol Parameter

Test Conditions

Min.

Max.

Unit

Output HIGH Voltage During Verify

µA

2.4

—

V

Output LOW Voltage During Verify

—

0.45

V

Input HIGH Voltage

2.0

V

Input LOW Voltage (All Inputs)

–0.3

0.8

V

A9 Auto Select Voltage

11.5

12.5

V

Input Current (All Inputs)

—

10.0

µA

—

50

mA

—30

mA

Supply Voltage

6.0

6.5

V

Programming Voltage

12.5

13.0

V

°C ± 5°C)

JEDEC

Std.

Symbol

Symbol

Parameter

Min.

Max.

Unit

Address Setup Time

2

—

µs

OE Setup Time

2

—

µs

Data Setup Time

2

—

µs

Address Hold Time

0

—

µs

Data Hold Time

2

—

µs

OE HIGH to Output Float Delay

0

130

ns

2

—

µs

PGM Program Pulse Width

95

105

µs

2

—

µs

CE Setup Time

2

—

µs

Data Valid from

OE

—

150

ns

Notes:

3. When programming IS27HC010, a 0.1

which may damage the device.

4. Programming characteristics are sampled but not 100% tested at worst-case conditions.