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FOD617 Datasheet(PDF) 4 Page - Fairchild Semiconductor |
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FOD617 Datasheet(HTML) 4 Page - Fairchild Semiconductor |
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4 / 12 page  4 www.fairchildsemi.com FOD814 Series, FOD617 Series, FOD817 Series Rev. 1.0.2 Transfer Characteristics (continued) (TA = 25°C Unless otherwise specified.) Isolation Characteristics *Typical values at TA = 25°C Notes 1. Current Transfer Ratio (CTR) = IC/IF x 100%. 2. For test circuit setup and waveforms, refer to page 4. 3. For this test, Pins 1 and 2 are common, and Pins 3 and 4 are common. AC Characteristic Device Test Conditions Symbol Min Typ* Max Unit Response Time (Rise) FOD814 FOD617 FOD817 VCE = 2 V, IC = 2 mA, RL = 100 Ω 2 tr —4 18 µs Response Time (Fall) FOD814 FOD617 FOD817 tf —3 18 µs Characteristic Device Test Conditions Symbol Min Typ* Max Units Input-Output Isolation Voltage3 FOD814 f = 60Hz, t = 1 min VISO 5000 Vac(rms) FOD617 FOD817 Isolation Resistance FOD814 VI-O = 500 VDC RISO 5x1010 1x1011 — Ω FOD617 FOD817 Isolation Capacitance FOD814 VI-O = 0, f = 1 MHz CISO 0.6 1.0 pf FOD617 FOD817 |
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