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AN78N00 Datasheet(PDF) 4 Page - Panasonic Semiconductor

Part No. AN78N00
Description  3-pin Positive Output Voltage Regulator 300mA Type
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Maker  PANASONIC [Panasonic Semiconductor]
Homepage  http://www.panasonic.com/industrial/
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AN78N00 Datasheet(HTML) 4 Page - Panasonic Semiconductor

   
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VO
7.3
V
7
VO
V
REGIN
70
mV
12
mV
REGL
mV
20
mV
mA
2.8
7
Ibias
mA
mA
50
Vno
dB
0.8
0.5
35
7.35
140
70
5
57
6.7
6.65
RR
V
2
mA
300
mA
500
10
69
– 0.4
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Input bias current fluctuation
Load vias current fluctuation
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short circuit current
Peak output current
Output voltage temperature coefficient
Parameter
Symbol
Condition
min
typ
max
Unit
VI=9.5 to 20V, IO=5 to 200mA
VI=9.5 to 25V, Tj=25˚C
IO=1 to 300mA, Tj=25˚C
IO=5 to 200mA, Tj=25˚C
VI=10 to 20V, Tj=25˚C
Tj=25˚C
VI=9.5 to 25V, Tj=25˚C
IO=1 to 300mA, Tj=25˚C
f=10Hz to 100kHz
VI=10 to 20V, IO=50mA, f=120Hz
IO=300mA, Tj=25˚C
VI=35V, Tj=25˚C
Tj=25˚C
IO=5mA, Tj=0 to 125˚C
Tj=25˚C
∆I
bias (IN)
∆I
bias (L)
µV
VDIF (min.)
IO (Short)
IO (Peak)
mV/˚C
∆V
O/Ta
Note 1) The specified condition Tj=25˚C means that the test should be carried out with the test time so short (within 10ms) that the
drift in characteristic value due to the rise in chip junction temperature can be ignored.
Note 2) When not specified, VI=12V, IO=100mA, CI=0.33
µF, C
O=0.1
µF, T
j=0 to 125˚C
s Electrical Characteristics (Ta=25˚C)
· AN78N07(7V Type)
VO
8.3
V
8
VO
V
REGIN
80
mV
13
mV
REGL
mV
25
mV
mA
2.8
8
Ibias
mA
mA
55
Vno
dB
0.8
0.5
40
8.4
160
80
5
56
7.7
7.6
RR
V
2
mA
300
mA
500
10
69
– 0.4
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Input bias current fluctuation
Load bias current fluctuation
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short circuit current
Peak output current
Output voltage temperature coefficient
Parameter
Symbol
Condition
min
typ
max
Unit
VI=10.5 to 23V, IO=5 to 200mA
VI=10.5 to 25V, Tj=25˚C
IO=1 to 300mA, Tj=25˚C
IO=5 to 200mA, Tj=25˚C
VI=12 to 23V, Tj=25˚C
Tj=25˚C
VI=10.5 to 25V, Tj=25˚C
IO=1 to 300mA, Tj=25˚C
f=10Hz to 100kHz
VI=11 to 21V, IO=50mA, f=120Hz
IO=300mA, Tj=25˚C
VI=35V, Tj=25˚C
Tj=25˚C
IO=5mA, Tj=0 to 125˚C
Tj=25˚C
∆I
bias (IN)
∆I
bias (L)
µV
VDIF (min.)
IO (Short)
IO (Peak)
mV/˚C
∆V
O/Ta
Note 1) The specified condition Tj=25˚C means that the test should be carried out with the test time so short (within 10ms) that the
drift in characteristic value due to the rise in chip junction temperature can be ignored.
Note 2) When not specified, VI=14V, IO=100mA, CI=0.33
µF, C
O=0.1
µF, T
j=0 to 125˚C
· AN78N08 (8V Type)


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