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PE3340 Datasheet(PDF) 5 Page - Peregrine Semiconductor Corp.

Part No. PE3340
Description  3.0 GHz Integer-N PLL for Low Phase Noise Applications
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Maker  PEREGRINE [Peregrine Semiconductor Corp.]
Homepage  http://www.peregrine-semi.com
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PE3340 Datasheet(HTML) 5 Page - Peregrine Semiconductor Corp.

 
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PE3340
Advance Information
PEREGRINE SEMICONDUCTOR CORP. ® | http://www.psemi.com
Copyright
© Peregrine Semiconductor Corp. 2004
Page 5 of 12
Table 6. AC Characteristics
VDD = 3.0 V, -40° C < TA < 85° C, unless otherwise specified
Symbol
Parameter
Conditions
Min
Max
Units
Control Interface and Latches (see Figures 3, 4)
fClk
Serial data clock frequency
(Note 1)
10
MHz
tClkH
Serial clock HIGH time
30
ns
tClkL
Serial clock LOW time
30
ns
tDSU
Sdata set-up time to Sclk rising edge
10
ns
tDHLD
Sdata hold time after Sclk rising edge
10
ns
tPW
S_WR pulse width
30
ns
tCWR
Sclk rising edge to S_WR rising edge
30
ns
tCE
Sclk falling edge to E_WR transition
30
ns
tWRC
S_WR falling edge to Sclk rising edge
30
ns
tEC
E_WR transition to Sclk rising edge
30
ns
Main Divider (Including Prescaler)
Fin
Operating frequency
500
3000
MHz
PFin
Input level range
External AC coupling
-5
5
dBm
Main Divider (Prescaler Bypassed)
Fin
Operating frequency
50
300
MHz
PFin
Input level range
External AC coupling
-5
5
dBm
Reference Divider
fr
Operating frequency
(Note 3)
100
MHz
Pfr
Reference input power (Note 2)
Single ended input
-2
dBm
Phase Detector
fc
Comparison frequency
(Note 3)
20
MHz
SSB Phase Noise (Fin = 1.3 GHz, fr = 10 MHz, fc = 1.25 MHz, LBW = 70 kHz, VDD = 3.0 V, Temp = -40° C)
100 Hz Offset
-75
dBc/Hz
1 kHz Offset
-85
dBc/Hz
Note 1:
fclk is verified during the functional pattern test. Serial programming sections of the functional pattern are clocked at 10 MHz to verify fclk
specification.
Note 2:
CMOS logic levels can be used to drive reference input if DC coupled. Voltage input needs to be a minimum of 0.5 Vp-p. For optimum phase
noise performance, the reference input falling edge rate should be faster than 80mV/ns.
Note 3:
Parameter is guaranteed through characterization only and is not tested.


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