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AF4901P Datasheet(PDF) 2 Page - Anachip Corp |
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AF4901P Datasheet(HTML) 2 Page - Anachip Corp |
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2 / 3 page  AF4901P Dual P-Channel 30-V (D-S) Common Drain MOSFET Anachip Corp. www.anachip.com.tw Rev. 1.0 Jul 16, 2004 2/3 Absolute Maximum Ratings (T A=25ºC unless otherwise noted) Symbol Parameter Rating Units VDS Drain-Source Voltage -30 V VGS Gate-Source Voltage ±25 V TA=25ºC -9.5 ID Continuous Drain Current (Note 1) TA=70ºC -7.5 A IDM Pulsed Drain Current (Note 2) ±30 A IS Continuous Source Current (Diode Conduction) (Note 1) -2.1 A TA=25ºC 3.1 PD Power Dissipation (Note 1) TA=70ºC 2.6 W TJ, TSTG Operating Junction and Storage Temperature Range -55 to 150 ºC Thermal Resistance Ratings Symbol Parameter Maximum Units RθJC Maximum Junction-to-Case (Note 1) t < 5 sec 40 ºC/W RθJA Maximum Junction-to-Ambient (Note 1) t < 5 sec 78 ºC/W Note 1: surface Mounted on 1”x 1” FR4 Board. Note 2: Pulse width limited by maximum junction temperature Specifications (T A=25ºC unless otherwise noted) Limits Symbol Parameter Test Conditions Min. Typ. Max. Unit Static V(BR)DSS Drain-Source breakdown Voltage VGS=0V, ID=-250uA -30 - - V VGS(th) Gate-Threshold Voltage VDS= VGS, ID=-250uA -1 -1.6 -3 V IGSS Gate-Body Leakage VDS=0V, VGS=±25V - - ±100 nA VDS=-24V, VGS=0V - - -1 IDSS Zero Gate Voltage Drain Current VDS=-24V, VGS=0V, TJ=55ºC - - -5 uA ID(on) On-State Drain Current (Note 3) VDS=-5V, VGS=-10V -30 - - A VGS=-10V, ID=-9.5A - 19 21 VGS=-4.5V, ID=-7.0A - 28 35 rDS(on) Drain-Source On-Resistance (Note 3) VGS=-10V, ID=-7A, TJ=125ºC - 26 34 mΩ gfs Forward Tranconductance (Note 3) VDS=-5V, ID=-13A - 19 - S VSD Diode Forward Voltage IS=2.1A, VGS=0V - -0.7 -1.2 V Dynamic (Note 4) Qg Total Gate Charge - 15 22 Qgs Gate-Source Charge - 4.7 - Qgd Gate-Drain Charge VDS=-15V, VGS=-5V, ID=-7A - 4.8 - nC Switching td(on) Turn-On Delay Time - 14 23 tr Rise Time - 11 20 td(off) Turn-Off Delay Time - 48 76 tf Fall-Time VDD=-15, RL=6Ω, ID=-1A, VGEN=-10V - 25 39 nS Note 3: Pulse test: PW < 300us duty cycle < 2%. Note 4: Guaranteed by design, not subject to production testing. |
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