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LM139JAN Datasheet(PDF) 4 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor. Click here to check the latest version.
Part No. LM139JAN
Description  Low Power Low Offset Voltage Quad Comparators
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Maker  NSC [National Semiconductor (TI)]
Homepage  http://www.national.com
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LM139JAN Datasheet(HTML) 4 Page - National Semiconductor (TI)

 
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Absolute Maximum Ratings (Note 1)
Supply Voltage, V
+
36 V
DC or ±18 VDC
Differential Input Voltage (Note 7)
36 V
DC
Output Voltage
36 V
DC
Input Voltage
−0.3 V
DC to +36 VDC
Input Current (V
IN < −0.3 VDC) (Note 3)
50 mA
Power Dissipation
(Notes 4, 12)
CERDIP
400 mW @ T
A = 125˚C
CERPACK
350 mW @ T
A = 125˚C
SOIC
350 mW @ T
A = 125˚C
Output Short-Circuit to GND,
(Note 2)
Continuous
Storage Temperature Range
−65˚C
≤ T
A
≤ +150˚C
Maximum Junction Temperature (T
J)
+175˚C
Lead Temperature
(Soldering, 10 seconds)
260˚C
Operating Temperature Range
−55˚C
≤ T
A
≤ +125˚C
Thermal Resistance
θ
JA
CERDIP
(Still Air)
103˚C/W
CERDIP
(500LF / Min Air flow)
65˚C/W
CERPACK
(Still Air)
183˚C/W
CERPACK
(500LF / Min Air flow)
120˚C/W
SOIC
(Still Air)
183˚C/W
SOIC
(500LF / Min Air flow)
120˚C/W
θ
JC
CERDIP
23˚C/W
CERPACK
23˚C/W
SOIC
23˚C/W
Package Weight (typical)
CERDIP
2,190mg
CERPACK
460mg
SOIC
410mg
ESD rating
(Note 11)
600V
Quality Conformance Inspection
Mil-Std-883, Method 5005 — Group A
Subgroup
Description
Temp (˚C)
1
Static tests at
25
2
Static tests at
125
3
Static tests at
-55
4
Dynamic tests at
25
5
Dynamic tests at
125
6
Dynamic tests at
-55
7
Functional tests at
25
8A
Functional tests at
125
8B
Functional tests at
-55
9
Switching tests at
25
10
Switching tests at
125
11
Switching tests at
-55
www.national.com
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