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LCP1521SRL Datasheet(PDF) 5 Page - STMicroelectronics |
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LCP1521SRL Datasheet(HTML) 5 Page - STMicroelectronics |
5 / 11 page LCP1521S/LCP152DEE Characteristics 5/11 Figure 3. Functional Holding Current (IH) test circuit: GO-NO GO test Figure 4. Test circuit for VFP and VDGL parameters Pulse (µs) Vp (V) C1 (µF) C2 (nF) L (µH) R1 ( Ω) R2 ( Ω) R3 ( Ω) R4 ( Ω) IPP (A) Rs ( Ω) tr tp 10 700 1500 20 200 0 501525253010 1.2 50 1500 1 33 0 761325253010 2 10 2500 10 0 1.1 1.3 0 3 3 38 62 R VBAT = - 100V Surge generator D.U.T This is a GO-NO GO test which allows to confirm the holding current (I ) level in a functional test circuit. - Adjust the current level at the I value by short circuiting the D.U.T. - Fire the D.U.T. with a surge current: I = 10A, 10/1000µs - The D.U.T. will come back to the off-state within a duration of 50ms max. H H PP TEST PROCEDURE: CC R R TIP RING GND VP 4 3 2 R 2 R1 (V is defined in unload condition) P L 1 |
Similar Part No. - LCP1521SRL |
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