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IDT5T9316NLI Datasheet(PDF) 5 Page - Integrated Device Technology |
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IDT5T9316NLI Datasheet(HTML) 5 Page - Integrated Device Technology |
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5 / 12 page  INDUSTRIALTEMPERATURERANGE IDT5T9316 2.5VLVDS1:16CLOCKBUFFERTERABUFFERII 5 DIFFERENTIAL INPUT AC TEST CONDITIONS FOR eHSTL Symbol Parameter Value Units VDIF Input Signal Swing(1) 1V VX DifferentialInputSignalCrossingPoint(2) 900 mV DH Duty Cycle 50 % VTHI InputTimingMeasurementReferenceLevel(3) CrossingPoint V tR, tF InputSignalEdgeRate(4) 2 V/ns NOTES: 1. The 1V peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VDIF (AC) specification under actual use conditions. 2. A 900mV crossing point level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VX specification under actual use conditions. 3. In all cases, input waveform timing is marked at the differential cross-point of the input signals. 4. The input signal edge rate of 2V/ns or greater is to be maintained in the 20% to 80% range of the input waveform. DIFFERENTIAL INPUT AC TEST CONDITIONS FOR HSTL Symbol Parameter Value Units VDIF Input Signal Swing(1) 1V VX DifferentialInputSignalCrossingPoint(2) 750 mV DH Duty Cycle 50 % VTHI InputTimingMeasurementReferenceLevel(3) CrossingPoint V tR, tF InputSignalEdgeRate(4) 2 V/ns NOTES: 1. The 1V peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VDIF (AC) specification under actual use conditions. 2. A 750mV crossing point level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VX specification under actual use conditions. 3. In all cases, input waveform timing is marked at the differential cross-point of the input signals. 4. The input signal edge rate of 2V/ns or greater is to be maintained in the 20% to 80% range of the input waveform. DIFFERENTIAL INPUT AC TEST CONDITIONS FOR LVEPECL (2.5V) AND LVPECL (3.3V) Symbol Parameter Value Units VDIF Input Signal Swing(1) 732 mV VX DifferentialInputSignalCrossingPoint(2) LVEPECL 1082 mV LVPECL 1880 DH Duty Cycle 50 % VTHI InputTimingMeasurementReferenceLevel(3) CrossingPoint V tR, tF InputSignalEdgeRate(4) 2 V/ns NOTES: 1. The 732mV peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VDIF (AC) specification under actual use conditions. 2. 1082mV LVEPECL (2.5V) and 1880mV LVPECL (3.3V) crossing point levels are specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VX specification under actual use conditions. 3. In all cases, input waveform timing is marked at the differential cross-point of the input signals. 4. The input signal edge rate of 2V/ns or greater is to be maintained in the 20% to 80% range of the input waveform. |
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