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SN74AVC32T245NMJ Datasheet(PDF) 7 Page - Texas Instruments |
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SN74AVC32T245NMJ Datasheet(HTML) 7 Page - Texas Instruments |
7 / 30 page ![]() PIN I/O DESCRIPTION NO. NAME R4 GND — Ground R5 4A5 Input/Output Referenced to VCCA R6 4A6 Input/Output Referenced to VCCA T1 4B7 Input/Output Referenced to VCCB T2 4B8 Input/Output Referenced to VCCB T3 4DIR Input Direction-control signal T4 4 OE Input Tri-State output-mode enables. Pull OE high to place all outputs in Tri-State mode. Referenced to VCCA T5 4A8 Input/Output Referenced to VCCA T6 4A7 Input/Output Referenced to VCCA 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted)(1) MIN MAX UNIT VCCA VCCB Supply voltage –0.5 4.6 V VI Input voltage(2) I/O ports (A port) –0.5 4.6 V I/O ports (B port) –0.5 4.6 Control inputs –0.5 4.6 VO Voltage applied to any output in the high-impedance or power-off state(2) A port –0.5 4.6 V B port –0.5 4.6 VO Voltage range applied to any output in the high or low state(2) (3) A port –0.5 VCCA + 0.5 V B port –0.5 VCCB + 0.5 IIK Input clamp current VI < 0 –50 mA IOK Output clamp current VO < 0 –50 mA IO Continuous output current ±50 mA Continuous current through each VCCA, VCCB, and GND ±100 mA Tstg Storage temperature –65 150 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) The input voltage and output negative-voltage ratings may be exceeded if the input and output current ratings are observed. (3) The output positive-voltage rating may be exceeded up to 4.6 V maximum if the output current rating is observed. 6.2 ESD Ratings VALUE UNIT V(ESD) Electrostatic discharge Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) ±8000 V Charged-device model (CDM), per JEDEC specification JESD22- C101(2) ±1000 (1) JEDEC document JEP155 states that 500V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250V CDM allows safe manufacturing with a standard ESD control process. www.ti.com SN74AVC32T245 SCES553G – MAY 2004 – REVISED JULY 2020 Copyright © 2020 Texas Instruments Incorporated Submit Document Feedback 7 Product Folder Links: SN74AVC32T245 |
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