11-4

Specifications HS-83C55RH

Valid Out Delay from Read Control (Note 1)

TRD

9, 10, 11

140

ns

Address Stable to Data Out Valid (Note 2)

TAD

9, 10, 11

340

ns

Latch Enable Width

TLL

9, 10, 11

-

ns

Read/Write Control of Latch Enable

TCL

9, 10, 11

-

ns

Read/Write Control Width

TCC

9, 10, 11

-

ns

Data In to Write Setup Time

TDW

9, 10, 11

-

ns

Data In Hold Time After Write

TWD

9, 10, 11

-

ns

Write to Port Output

TWP

9, 10, 11

300

ns

Port Input Setup Time

TPR

9, 10, 11

-

ns

Port Input Hold Time

TRP

9, 10, 11

-

ns

Ready Hold Time

TRYH

9, 10, 11

160

ns

Address CE to Ready

TARY

9, 10, 11

160

ns

Recovery Time Between Controls

TRV

9, 10, 11

-

ns

NOTES:

1. Or TAD - (TAL + TLC), whichever is greater.

2. Defines ALE to Data Out Valid in conjunction with TAL.

TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS

PARAMETERS

SYMBOL

(NOTE 1)

CONDITIONS

TEMPERATURE

LIMITS

UNITS

MIN

MAX

Input Capacitance

CIN

VDD = Open, f = 1MHz

-

10

pF

I/O Capacitance

CI/O

VDD = Open, f = 1MHz

-

12

pF

Output Capacitance

COUT

VDD = Open, f = 1MHz

-

10

pF

NOTE:

1. All measurements referenced to device ground.

TABLE 4. POST 100K RAD ELECTRICAL PERFORMANCE CHARACTERISTICS

NOTE: The post irradiation test conditions and limits are the same as those listed in Table 1 and 2.

PARAMETER

SYMBOL

DELTA LIMITS

Output Low Voltage

VOL

± 60mV

Output High Voltage

VOH

± 400mV

Input Leakage Current

IIL

± 100nA

Input Leakage Current

IIH

± 100nA

Static Current

IDDSB

±30µA

TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)

AC Tests are Guaranteed Through Functional Testing with the Clock Period Equal to 500ns. TRDE + TRDF are the Only Read and Record

Parameters. Output Timings are Measured with a Capacitive Load CL = 170pF, VIH = 4.25, and VIL = 0.8V

PARAMETERS

SYMBOL

GROUP A

SUBGROUPS

TEMPERATURE

LIMITS

UNITS

MIN

MAX