STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-90737
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
C
SHEET
7
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics – Continued.
Test
Symbol
Conditions 1/
-55
°C ≤ TA ≤ +125°C
unless otherwise specified
Group A
subgroups
Device
type
Limits
Unit
Min
Max
Break-before-make time
delay
tD
RL = 300 Ω, CL = 36 pF,
VS1 = VS2 = ±10 V,
TA = +25°C,
see figures 5 and 6
9
03
5
150
ns
Functional tests
FT
See 4.4.1c
7,8
All
Positive supply current
I+
V+ = +16.5 V, V- = -16.5 V,
1
All
±1
µA
VIN = 0 V, 5 V
2,3
±5
Negative supply current
I-
V+ = +16.5 V, V- = -16.5 V,
1
All
±1
µA
VIN = 0 V, 5 V
2,3
±5
Logic supply current
IL
V+ = +16.5 V, V- = -16.5 V,
1
All
±1
µA
VIN = 0 V, 5 V
2,3
±5
Ground current
IGND
V+ = +16.5 V, V- = -16.5 V,
1
All
±1
µA
VIN = 0 V, 5 V
2,3
±5
1/ Unless otherwise specified, V+ = +15 V, V- = -15 V, VL = 5 V, and GND = 0 V.
2/ VIN = input voltage to perform proper function.
3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2
herein) involving devices acquired to this drawing is required for any change as defined in MIL-PRF-38535, appendix A.
3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain
the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made
available onshore at the option of the reviewer.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
microcircuit group number 82 (see MIL-PRF-38535, appendix A).
English ▼
English
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
Indian
Mexican
British
New Zealand
