Datasheet

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LIV Test Capability

The Model 2520 can perform pulsed LIV testing up to 5A and

continuous LIV testing up to 1A. Its pulsed testing capability

makes it suitable for testing a broad range of laser diodes,

including the pump laser designs for Raman amplifiers. The

instrument’s ability to perform both DC and pulsed LIV sweeps

on the same device simplifies analyzing the impact of thermal

transients on the LIV characteristics of the laser diode.

Maximize Throughput and Eliminate

Production Bottlenecks

By working in cooperation with leading laser diode

manufacturers, Keithley designed the Model 2520 specifically

to enhance chip- and bar-level test stand yield and

throughput. Its integrated design, ease of use, high speed,

and high accuracy provides a complete solution to help

laser diode manufacturers meet their production schedules.

Producers of laser diodes face constant pressure to increase

test throughput and optimize return on investment for their

capital equipment used in production testing. Until recently,

these producers were forced to use relatively slow and

cumbersome test stands for testing laser diodes at the chip

and bar level, which often led to production bottlenecks.

Higher Resolution for Higher Yields

To achieve the required signal-to-noise ratio, traditional

chip- and bar-level LIV testing solutions have required

the use of boxcar averagers or test system control

software modifications to allow averaging several pulsed

measurements. The resolution of these measurements is

critical for the “kink” test and threshold current calculations.

With earlier test system designs, particularly when

performing the kink test, low resolution and poor linearity of

the analog digitizer made it extremely difficult to discriminate

between noise in the measurement and an actual device

kink. The Model 2520’s unique DSP-based measurement

approach automatically identifies the settled region of

the pulsed waveforms measured. This means the Model

2520 stores only that portion of the pulse that is “flat” and

contains meaningful data. All measurements made in the

flat portion of the pulse are averaged to improve the Signal-

to-Noise ratio still further. If greater resolution is required,

the Model 2520 can be programmed to perform several

pulse and measure cycles at the same pulse amplitude. By

making it possible to conduct more thorough testing at the

bar or chip level, the Model 2520 also eliminates the wasted

time and costs associated with assembling then scrapping

modules with non-compliant diodes.

Simple, One-Box Test Solution

The Model 2520 offers three channels of source and

measurement circuitry. All three channels are controlled by

a single digital signal processor (DSP), which ensures tight

synchronization of the sourcing and measuring functions.

The laser diode drive channel provides a current source

coupled with voltage measurement capability. Each of

the two photodetector channels supplies an adjustable

voltage bias and voltage compliance, in addition to current

measurement capability. These three channels provide all

the source and measure capabilities needed for full LIV

characterization of laser diodes prior to integration into

temperature controlled modules. By eliminating the need

for GPIB commands to perform test sweeps with multiple

separate instruments, the Model 2520’s integrated sourcing

and measurement allows a significant improvement in

throughput.

Ordering Information

2520 Pulsed Laser Diode Test System with

Remote Test Head

Accessories Supplied

User’s Manual, Quick Reference Guide,

Triax Cables (2), BNC 10W Coaxial Cables (4)

Accessories Available

7007-1

Double Shielded GPIB

Cable, 1m (3.3 ft.)

7007-2

Double Shielded GPIB

Cable, 2m (6.6 ft.)

KPCI-488LPA

IEEE-488 Interface/

Controller for the PCI Bus

KUSB-488B

IEEE-488 USB-to-GPIB

Adapter for USB Port

Services Available

2520-3Y-EW

1-year factory warranty

extended to 3 years from

date of shipment

C/2520-3Y-DATA 3

(Z540-1 compliant)

calibrations within 3 years

of purchase*

*Not available in all countries