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4200-SMU Datasheet(PDF) 4 Page - TEKTRONIX, INC. |
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4200-SMU Datasheet(HTML) 4 Page - TEKTRONIX, INC. |
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4 / 45 page  TEK.COM 5 4200A-SCS Parameter Analyzer 1. Clarius Software Take your research to new levels of understanding with the new Clarius Software user interface. The 4200A-SCS includes the Clarius+ software package, which allows peforming nearly any type of I-V, C-V, and pulsed I-V characterization test. The Clarius Software user interface provides touch-and-swipe or point-and-click control for advanced test definition, parameter analysis, graphing, and automation capabilities for modern semiconductor, materials, and process characterization. Key Features • Ready-to-use, modifiable application tests, projects and devices that reduce test development time • Industry’s first instrument with built-in measurement videos from world-wide Application engineers, in four languages, to reduce learning curve • Pin to pad contact check ensures reliable measurements • Multiple measurement functions • Data display, analysis and arithmetic functions Reduce Characterization Complexity with Expert Videos Engage quickly with your application and reduce your learning curve by watching built-in videos from Keithley worldwide application engineers. Hours of expert measurement expertise help will guide you when unexpected results occur or questions arise on how to set up your test. All videos are provided in English, and many are translated into other languages including Chinese, Japanese, and Korean. These short expert videos enable quick insight to your bold discoveries. Select from Ready-to-Use Application Tests With over 450 furnished application tests in the Clarius library, select or modify the pre-defined application tests to accelerate your characterization or easily create custom tests from the beginning. With three easy steps, Clarius Software guides even the new user through parameter analysis like an expert. Real-time Results and Parameters Accelerate your time to insight with automated data display, arithmetic functions, analysis and real-time parameter extraction. Never worry about losing your data because all test history is stored. Verify Pulse Measurements without an Oscilloscope Pulse timing preview mode provides an easy-to-read view of your pulse timing parameters that confirms your pulsed I-V test will execute as needed. Use the transient I-V or waveform capture mode to make time-based current or voltage measurements without the need of an external oscilloscope. Typical Applications MOSFET, BJT Transistors Materials Characterization Non-volatile Memory Devices Resistivity & Hall Effect Measurements NBTI/PBTI III-V Devices Failure Analysis Nanoscale Devices Diodes and pn Junctions Solar Cells Sensors MEMS Devices Electrochemistry LED and OLED |
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