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MC10E193 Datasheet(PDF) 1 Page - ON Semiconductor

Part No. MC10E193
Description  ERROR DETECTION/ CORRECTION CIRCUIT
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
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MC10E193 Datasheet(HTML) 1 Page - ON Semiconductor

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MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
2–1
REV 3
© Motorola, Inc. 1996
7/96
Error Detection/Correction
Circuit
The MC10E/100E193 is an error detection and correction (EDAC)
circuit. Modified Hamming parity codes are generated on an 8-bit word
according to the pattern shown in the logic symbol. The P5 output gives
the parity of the whole word. The word parity is also provided at the PGEN
pin, after Odd/Even parity control and gating with the BPAR input. This
output also feeds to a 1-bit shiftable register, for use as part of a scan ring.
Used in conjunction with 12-bit parity generators such as the E160, a
SECDED (single error correction, double error detection) error system
can be designed for a multiple of an 8-bit word.
Hamming Code Generation
8-Bit Word, Expandable
Provides Parity of Whole Word
Scannable Parity Register
Extended 100E VEE Range of – 4.2V to – 5.46V
75kΩ Input Pulldown Resistors
Pinout: 28-Lead PLCC (Top View)
B4
B5
B6
P2
PGEN
CLK
SHIFT
S-IN
HOLD
EN
LOGIC DIAGRAM
EV/OD
BPAR
B0
VEE
B1
B2
B3
26
27
28
2
3
4
25
24
23
22
21
20
19
18
17
16
15
14
13
12
11
5
6
7
8
9
10
VCCO
PARERR
PARERR
VCC
P5
VCCO
P4
P3
VCCO P1
B7
B INPUTS
0 3 6 5 7 4 2 1
B2, B3, B6, B7
B1, B3, B5, B7
B4, B5, B6, B7
B1, B2, B4, B7
P2
P1
P3
P4
P5
PGEN
BYTE (B0 – B7)
PARERR
PARERR
BPAR
EV/OD
EN
HOLD
S-IN
SHIFT
CLK
0
1
0
1
D
1
* All VCC and VCCO pins are tied together on the die.
MC10E193
MC100E193
ERROR DETECTION/
CORRECTION CIRCUIT
FN SUFFIX
PLASTIC PACKAGE
CASE 776-02


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