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ADS8381 Datasheet(PDF) 3 Page - Texas Instruments |
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ADS8381 Datasheet(HTML) 3 Page - Texas Instruments |
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3 / 35 page 
ADS8381 SLAS364D − APRIL 2002 − REVISED FEBRUARY 2005 www.ti.com 3 SPECIFICATIONS TA = −40°C to 85°C, +VA = 5 V, +VBD = 3 V or 5 V, Vref = 4.096 V, fSAMPLE = 580 kHz (unless otherwise noted) PARAMETER TEST ADS8381IB ADS8381I UNIT PARAMETER TEST CONDITIONS MIN TYP MAX MIN TYP MAX UNIT Analog Input Full-scale input voltage (see Note 1) +IN − −IN 0 Vref 0 Vref V Absolute input voltage +IN −0.2 Vref + 0.2 −0.2 Vref + 0.2 V Absolute input voltage −IN −0.2 0.2 −0.2 0.2 V Input capacitance 45 45 pF Input leakage current 1 1 nA System Performance Resolution 18 18 Bits No missing codes 18 17 Bits Integral linearity (see Notes 2 and 3) < 0.125 FS −4 −2.2/1 4 −5 5 LSB Integral linearity (see Notes 2 and 3) > 0.125 FS −5 −3/2 5 −6 6 LSB (18 bit) Differential linearity −1 −0.6/1.25 2 −2 3 LSB (18 bit) Offset error −0.75 ±0.25 0.75 −1 ±0.5 1 mV Gain error (see Note 4) −0.075 0.075 −0.1 0.1 %FS Noise 60 60 µV RMS Power supply rejection ratio At 3FFFFh output code 75 75 dB Sampling Dynamics Conversion time 1.4 1.4 µs Acquisition time 0.3 0.3 µs Throughput rate 580 580 kHz Aperture delay 4 4 ns Aperture jitter 15 15 ps Step response 150 150 ns Over voltage recovery 150 150 ns (1) Ideal input span, does not include gain or offset error. (2) LSB means least significant bit (3) This is endpoint INL, not best fit. (4) Measured relative to an ideal full-scale input (+IN − −IN) of 4.096 V |
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