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DS26F32MJ/883 Datasheet(PDF) 1 Page - National Semiconductor (TI) |
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DS26F32MJ/883 Datasheet(HTML) 1 Page - National Semiconductor (TI) |
1 / 12 page Original Creation Date: 05/20/99 Last Update Date: 05/04/01 Last Major Revision Date: MNDS26F32M-X-RH REV 0C0 MICROCIRCUIT DATA SHEET QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A General Description The DS26F32 is a quad differential line receiver designed to meet the requirements of EIA Standards RS-422 and RS-423, and Federal Standards 1020 and 1030 for balanced and unbalanced digital data transmission. The DS26F32 offers improved performance due to the use of state-of-the-art L-FAST bipolar technology. The L-FAST technology allows for higher speeds and lower currents by utilizing extremely short gate delay times. The device features an input sensitivity of 200mV over the input common mode range of +7.0V. The DS26F32 provides an enable function common to all four receivers and TRI-STATE outputs with 8.0 mA sink capability. Also, a fail-safe input/output relationship keeps the outputs high when the inputs are open. The DS26F32 offers optimum performance when used with the DS26F31 Quad Differential Line Driver. NS Part Numbers DS26F32ME/883 DS26F32MER-QML DS26F32MJ-QMLV DS26F32MJ/883 DS26F32MJR-QML DS26F32MJRQMLV DS26F32MW-QMLV DS26F32MW/883 DS26F32MWG/883 DS26F32MWGRQMLV DS26F32MWR-QML DS26F32MWRQMLV Industry Part Number DS26F32 Prime Die M632 Controlling Document SEE FEATURES SECTION Processing MIL-STD-883, Method 5004 Quality Conformance Inspection MIL-STD-883, Method 5005 Subgrp Description Temp ( C) o 1 Static tests at +25 2 Static tests at +125 3 Static tests at -55 4 Dynamic tests at +25 5 Dynamic tests at +125 6 Dynamic tests at -55 7 Functional tests at +25 8A Functional tests at +125 8B Functional tests at -55 9 Switching tests at +25 10 Switching tests at +125 11 Switching tests at -55 1 |
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