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TMS29F800T-120BDBJE Datasheet(PDF) 1 Page - Texas Instruments

Part # TMS29F800T-120BDBJE
Description  1048576 BY 8-BIT/ 524288 BY 16-BIT FLASH MEMORIES
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

TMS29F800T-120BDBJE Datasheet(HTML) 1 Page - Texas Instruments

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TMS29F800T, TMS29F800B
1048576 BY 8-BIT/ 524288 BY 16-BIT
FLASH MEMORIES
SMJS835B – MAY 1997 – REVISED OCTOBER 1997
1
POST OFFICE BOX 1443
HOUSTON, TEXAS 77251–1443
D Single Power Supply Supports 5 V "10%
Read/Write Operation
D Organization... 1048576 By 8 Bits
524 288 By 16 Bits
D Array-Blocking Architecture
– One 16K-Byte/One 8K-Word Boot Sector
– Two 8K-Byte/4K-Word Parameter Sectors
– One 32K-Byte/16K-Word Sector
– Fifteen 64K-Byte/32K-Word Sectors
– Any Combination of Sectors Can Be
Erased. Supports Full-Chip Erase
– Any Combination of Sectors Can Be
Marked as Read-Only
D Boot-Code Sector Architecture
– T = Top Sector
– B = Bottom Sector
D Sector Protection
– Hardware Protection Method That
Disables Any Combination of Sectors
From Write or Erase Operations Using
Standard Programming Equipment
D Embedded Program/Erase Algorithms
– Automatically Pre-Programs and Erases
Any Sector
– Automatically Programs and Verifies the
Program Data at Specified Address
D JEDEC Standards
– Compatible With JEDEC Byte Pinouts
– Compatible With JEDEC EEPROM
Command Set
D Fully Automated On-Chip Erase and
Program Operations
D 100 000 Program/Erase Cycles
D Low Power Dissipation
– 40-mA Typical Active Read for Byte Mode
– 50-mA Typical Active Read for Word
Mode
– 60-mA Typical Program/Erase Current
– Less Than 100-
µA Standby Current
– 5
µA in Deep Power-Down Mode
D All Inputs/Outputs TTL-Compatible
D Erase Suspend/Resume
– Supports Reading Data From, or
Programming Data to, a Sector Not
Being Erased
D Hardware-Reset Pin Initializes the
Internal-State Machine to the Read
Operation
D Package Options
– 44-Pin Plastic Small-Outline Package
(PSOP) (DBJ Suffix)
– 48-Pin Thin Small-Outline Package
(TSOP) (DCD Suffix)
D Detection Of Program/Erase Operation
– Data Polling and Toggle Bit Feature of
Program/Erase Cycle Completion
– Hardware Method for Detection of
Program/Erase Cycle Completion
Through Ready/Busy (RY/BY) Output Pin
D High-Speed Data Access at 5-V VCC"10%
at Three Temperature Ranges
– 80 ns
Commercial ...0
°C to 70°C
– 90 ns
Commercial ...0
°C to 70°C
– 100 ns
Extended...–40
°C to 85°C
– 120 ns
Automotive ...–40
°C to 125°C
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
Copyright
© 1997, Texas Instruments Incorporated
A[0:18]
Address Inputs
BYTE
Byte/Word Enable
DQ[0:14]
Data In / Data out
DQ15/A–1
Data In/Out (Word-Wide Mode)
Low-Order Address (Byte-Wide Mode)
CE
Chip Enable
OE
Output Enable
NC
No Internal Connection
RESET
Reset / Deep Power Down
RY / BY
Ready / Busy Output
VCC
Power Supply
V
SS
Ground
WE
Write Enable
PIN NOMENCLATURE


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