IC41C1665

IC41LV1665

Integrated Circuit Solution Inc.

7

DR031-0A 10/17/2001

Symbol Parameter

Test Condition

Speed Min.

Max.

Unit

Input Leakage Current

Any input 0V

–10

10

µA

Other inputs not under test = 0V

Output Leakage Current

Output is disabled (Hi-Z)

–10

10

µA

0V

Output High Voltage Level

2.4

—

V

Output Low Voltage Level

—

0.4

V

Stand-by Current: TTL

5V

—

2

mA

mA

Stand-by Current: TTL

3.3V

—

1

mA

mA

Stand-by Current: CMOS

5V

—

1

mA

Stand-by Current: CMOS

3.3V

—

0.5

mA

Operating Current:

RAS, LCAS, UCAS,

-25

—

170

mA

-30

—

150

Average Power Supply Current

-35

—

130

-40

—

120

Operating Current:

-25

—

170

mA

-30

—

150

Average Power Supply Current

-35

—

130

-40

—

120

Refresh Current:

-25

—

170

mA

-30

—

150

Average Power Supply Current

-35

—

130

-40

—

120

Refresh Current:

RAS, LCAS, UCAS Cycling

-25

—

170

mA

-30

—

150

Average Power Supply Current

-35

—

130

-40

—

120

Notes:

1. An initial pause of 200 µs is required after power-up followed by eight

RAS refresh cycles (RAS-Only or CBR) before proper

device operation is assured.The eight

exceeded.

2. Dependent on cycle rates.

3. Specified values are obtained with minimum cycle time and the output open.

4. Column-address is changed once each fast page cycle.

5. Enables on-chip refresh and address counters.