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ADS8406 Datasheet(PDF) 2 Page - Burr-Brown (TI)

[Old version datasheet] Texas Instruments acquired Burr-Brown Corporation. Click here to check the latest version.
Part No. ADS8406
Description  16-BIT, 1.25 MSPS, PSEUDO-BIPOLAR, FULLY DIFFERENTIAL INPUT, MICRO POWER SAMPLING ANALOG-TO-DIGITAL CONVERTER WITH PARALLEL INTERFACE
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Manufacturer  BURR-BROWN [Burr-Brown (TI)]
Direct Link  http://www.burr-brown.com
Logo BURR-BROWN - Burr-Brown (TI)

ADS8406 Datasheet(HTML) 2 Page - Burr-Brown (TI)

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ABSOLUTE MAXIMUM RATINGS
ADS8406
SLAS426A – AUGUST 2004 – REVISED DECEMBER 2004
ORDERING INFORMATION(1)
MAXIMUM
MAXIMUM
NO MISSING
PACKAGE
TEMPERA-
TRANSPORT
INTEGRAL
DIFFERENTIAL
CODES
PACKAGE
ORDERING
MODEL
DESIG-
TURE
MEDIA
LINEARITY
LINEARITY
RESOLUTION
TYPE
INFORMATION
NATOR
RANGE
QUANTITY
(LSB)
(LSB)
(BIT)
Tape and reel
ADS8406IPFBT
250
48 Pin
ADS8406I
–4 to +4
–2 to +2
15
PFB
–40
°C to 85°C
TQFP
Tape and reel
ADS8406IPFBR
1000
Tape and reel
ADS8406IBPFBT
250
48 Pin
ADS8406IB
–2 to +2
–1 to +1.25
16
PFB
–40
°C to 85°C
TQFP
Tape and reel
ADS8406IBPFBR
1000
(1)
For the most current specifications and package information, refer to our website at www.ti.com.
over operating free-air temperature range unless otherwise noted(1)
UNIT
+IN to AGND
–0.4 V to +VA + 0.1 V
Voltage
–IN to AGND
–0.4 V to +VA + 0.1 V
+VA to AGND
–0.3 V to 7 V
Voltage range
+VBD to BDGND
–0.3 V to 7 V
+VA to +VBD
–0.3 V to 2.55 V
Digital input voltage to BDGND
–0.3 V to +VBD + 0.3 V
Digital output voltage to BDGND
–0.3 V to +VBD + 0.3 V
TA
Operating free-air temperature range
–40
°C to 85°C
Tstg
Storage temperature range
–65
°C to 150°C
Junction temperature (TJ max)
150
°C
Power dissipation
(TJMax - TA)/θJA
TQFP package
θ
JA thermal impedance
86
°C/W
Vapor phase (60 sec)
215
°C
Lead temperature, soldering
Infrared (15 sec)
220
°C
(1)
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
2


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