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MC74LCX244DTR2G Datasheet(PDF) 3 Page - ON Semiconductor

Part No. MC74LCX244DTR2G
Description  Low-Voltage CMOS Octal Buffer
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Maker  ONSEMI [ON Semiconductor]
Homepage  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

MC74LCX244DTR2G Datasheet(HTML) 3 Page - ON Semiconductor

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MC74LCX244
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3
MAXIMUM RATINGS
Symbol
Parameter
Value
Condition
Units
VCC
DC Supply Voltage
−0.5 to +7.0
V
VI
DC Input Voltage
−0.5
≤ VI ≤ +7.0
V
VO
DC Output Voltage
−0.5
≤ VO ≤ +7.0
Output in 3−State
V
−0.5
≤ VO ≤ VCC + 0.5
Output in HIGH or LOW State (Note 1)
V
IIK
DC Input Diode Current
−50
VI < GND
mA
IOK
DC Output Diode Current
−50
VO < GND
mA
+50
VO > VCC
mA
IO
DC Output Source/Sink Current
±50
mA
ICC
DC Supply Current Per Supply Pin
±100
mA
IGND
DC Ground Current Per Ground Pin
±100
mA
TSTG
Storage Temperature Range
−65 to +150
°C
TL
Lead Temperature, 1 mm from Case
for 10 Seconds
TL = 260
°C
TJ
Junction Temperature Under Bias
TJ = 150
°C
qJA
Thermal Resistance (Note 2)
qJA = 140
°C/W
MSL
Moisture Sensitivity
Level 1
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. IO absolute maximum rating must be observed.
2. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2 ounce copper trace no air flow.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Typ
Max
Units
VCC
Supply Voltage
Operating
Data Retention Only
2.0
1.5
2.5, 3.3
2.5, 3.3
5.5
5.5
V
VI
Input Voltage
0
5.5
V
VO
Output Voltage
HIGH or LOW State
3−State
0
0
VCC
5.5
V
IOH
HIGH Level Output Current
VCC = 3.0 V − 3.6 V
VCC = 2.7 V − 3.0 V
−24
−12
mA
IOL
LOW Level Output Current
VCC = 3.0 V − 3.6 V
VCC = 2.7 V − 3.0 V
24
12
mA
TA
Operating Free−Air Temperature
−55
+125
°C
Dt/DV
Input Transition Rise or Fall Rate, VIN from 0.8 V to 2.0 V, VCC = 3.0 V
0
10
ns/V
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.


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