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CY54/74FCT543T
3
Electrical Characteristics Over the Operating Range
Parameter
Description
Test Conditions
Min.
Typ.[7]
Max.
Unit
VOH
Output HIGH Voltage
VCC=Min., IOH=–32 mA
Com’l
2.0
V
VCC=Min., IOH=–15 mA
Com’l
2.4
3.3
V
VCC=Min., IOH=–12 mA
Mil
2.4
3.3
V
VOL
Output LOW Voltage
VCC=Min., IOL=64 mA
Com’l
0.3
0.55
V
VCC=Min., IOL=48mA
Mil
0.3
0.55
V
VIH
Input HIGH Voltage
2.0
V
VIL
Input LOW Voltage
0.8
V
VH
Hysteresis[8]
All inputs
0.2
V
VIK
Input Clamp Diode Voltage
VCC=Min., IIN=–18 mA
–0.7
–1.2
V
IIH
Input HIGH Current
VCC=Max., VIN=VCC
5
µA
IIH
Input HIGH Current[8]
VCC=Max., VIN=2.7V
±1
µA
IIL
Input LOW Current[8]
VCC=Max., VIN=0.5V
±1
µA
IOZH
Off State HIGH-Level Output
Current
VCC=Max., VOUT = 2.7V
10
µA
IOZL
Off State LOW-Level
Output Current
VCC= Max., VOUT = 0.5V
–10
µA
IOS
Output Short Circuit Current[9]
VCC=Max., VOUT=0.0V
–60
–120
–225
mA
IOFF
Power-Off Disable
VCC=0V, VOUT=4.5V
±1
µA
Capacitance[8]
Parameter
Description
Typ.[7]
Max.
Unit
CIN
Input Capacitance
5
10
pF
COUT
Output Capacitance
9
12
pF
Notes:
7.
Typical values are at VCC=5.0V, TA=+25°C ambient.
8.
This parameter is guaranteed but not tested.
9.
Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, IOS tests should be performed last.
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