Pre-and Post-Stress

Electrical Test

2 High Temperature

The measured and observed characteristics should satisfy Solder the capacitor on the test substrate(glass epoxy board).

Exposure (Storage)

the specifications in the following table.

Set the capacitor for 1000+/-12h at 150+/-3℃.

Appearance No marking defects

Set for 24+/-2h at room temperature, then measure.

Capacitance Within +/-10.0%

・ Initial measurement

Change

Perform a heat treatment at 150+0/-10 ℃for 1h and then sit

D.F.

0.03 max.

for 24+/-2h at room temperature.Perform the initial measurement.

I.R.

Within the specified initial value.

25℃

3 Temperature Cycling

The measured and observed characteristics should satisfy Solder the capacitor on the test substrate(glass epoxy board).

the specifications in the following table.

Perform the 1000 cycles test according to the four heat treatments

Appearance No marking defects

listed in the following table.

Set for 24+/-2h at room temperature, then measure.

Capacitance Within +/-10.0%

Change

D.F.

0.03 max.

・ Initial measurement

I.R.

Within the specified initial value.

Perform a heat treatment at 150+0/-10 ℃for 1h and then sit

25℃

for 24+/-2h at room temperature.Perform the initial measurement.

4 Destructive

No defects or abnormalities

Per EIA-469.

Physical Analysis

5 Moisture Resistance

The measured and observed characteristics should satisfy Solder the capacitor on the test substrate(glass epoxy board).

the specifications in the following table.

Apply the 24h heat (25℃ to 65℃) and humidity (80%RH to 98%RH)

Appearance No marking defects

treatment shown below, 10 consecutive times.

Set for 24+/-2h at room temperature, then measure.

Capacitance Within +/-12.5%

Change

D.F.

0.03 max.

I.R.

Within the specified initial value.

25℃

・ Initial measurement

Perform a heat treatment at 150+0/-10 ℃for 1h and then sit

for 24+/-2h at room temperature.Perform the initial measurement.

6 Biased Humidity

The measured and observed characteristics should satisfy Solder the capacitor on the test substrate(glass epoxy board).

the specifications in the following table.

Apply the rated voltage and 1.3+0.2/-0Vdc (add 6.8kΩ resister)

Appearance No marking defects

at 85+/-3℃ and 80%RH to 85%RH humidity for 1000+/-12h.

The charge/discharge current is less than 50mA.

Capacitance Within +/-12.5%

Remove and set for 24+/-2h at room temperature, then measure.

Change

D.F.

0.035 max.

・ Initial measurement

Perform a heat treatment at 150+0/-10 ℃for 1h and then sit

I.R.

More than 1,000MΩ or 50Ω・F

for 24+/-2h at room temperature.Perform the initial measurement.

25℃

(Whichever is smaller)

■AEC-Q200 Murata Standard Specification and Test Methods

No

AEC-Q200 Test Item

Specification.

AEC-Q200 Test Method

1

-

One cycle 24hours

Hours

Initial measuremt

+10

- 2 ℃

Humidity

90～98%

Humidity

80～98%

Humidity

80～98%

Humidity

90～98%

Humidity

90～98%

0

1 2

3

4 5

6

7

8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24

Temperature

70

65

60

55

50

45

40

35

30

25

20

15

10

5

0

-5

-10

(℃)

Step

1

2

3

4

Temp.

(

C)

Min.Operating Temp.+0/-3

Room

Temp. Max.Operating Temp. +3/-0

Room

Temp.

Time

(min)

15+/-3

1

15+/-3

1

JEMCGS-00806D

2