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GCM21BR72A103KA37 Datasheet(PDF) 3 Page - Murata Manufacturing Co., Ltd.

Part No. GCM21BR72A103KA37
Description  CHIP MONOLITHIC CERAMIC CAPACITOR FOR AUTOMOTIVE
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Manufacturer  MURATA [Murata Manufacturing Co., Ltd.]
Direct Link  http://www.murata.com
Logo MURATA - Murata Manufacturing Co., Ltd.

GCM21BR72A103KA37 Datasheet(HTML) 3 Page - Murata Manufacturing Co., Ltd.

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Temperature
Compensating Type
High Dielectric Type
7 Operational Life
The measured and observed characteristics should satisfy the
Apply 200% of the rated voltage for 1000±12 hours at 125±3℃(for
specifications in the following table.
Δ C/R7), 150±3℃(for 5G/L8/R9).
Appearance
No marking defects
Set for 24±2 hours at room temperature, then measure.
Capacitance
Within ±3.0% or ±0.30pF
R7/L8/R9: Within ±12.5%
The charge/discharge current is less than 50mA.
Change
(Whichever is larger)
Q/D.F.
30pFmin. : Q≧350
R7/L8 : W.V.: 25Vmin.: 0.035 max.
・ Initial measurement for high dielectric constant type.
10pF and over, 30pF and below:
(GCM155R71H 562-223: 0.05max)
Apply 200% of the rated DC voltage for one hour at the maximun
Q≧275+5C/2
W.V.: 16V/10V : 0.05 max.
operating temperature ±3℃. Remove and set for 24±2 hours at
10pFmax.: Q ≧200+10C
R9 : 0.075max.
room temperature. Perform initial measurement.
C: Nominal Capacitance(pF)
I.R.
More than 1,000M
Ω or 50Ω ・F
(Whichever is smaller)
8 External Visual
No defects or abnormalities
Visual inspection
9 Phisical Dimension
Within the specified dimensions
Using calipers
10 Resistance to Appearance
No marking defects
Per MIL-STD-202 Method 215
Solvents
Capacitance
Within the specified tolerance
Solvent 1 : 1 part (by volume) of isopropyl alcohol
Change
3 parts (by volume) of mineral spirits
Q/D.F.
30pFmin. : Q≧1000
R7/L8 : W.V.: 25Vmin.: 0.025 max.
Solvent 2 : Terpene defluxer
30pFmax.: Q ≧400+20C
W.V.: 16V/10V : 0.035 max.
Solvent 3 : 42 parts (by volume) of water
C: Nominal Capacitance(pF)
R9 : 0.05max.
1part (by volume) of propylene glycol monomethylether
1 part (by volume) of monoethanolomine
I.R.
More than 10,000M
Ω or 500Ω ・F
(Whichever is smaller)
11 Mechanical
Appearance
No marking defects
Three shocks in each direction should be applied along 3 mutually
Shock
Capacitance
Within the specified tolerance
perpendicular axes of the test specimen (18 shocks).
Change
The specified test pulse should be Half-sine and should have a
Q/D.F.
30pFmin. : Q≧1000
R7/L8 : W.V.: 25Vmin.: 0.025 max.
duration :0.5ms, peak value:1500g and velocity change: 4.7m/s.
30pFmax.: Q ≧400+20C
W.V.: 16V/10V : 0.035 max.
C: Nominal Capacitance(pF)
R9 : 0.05max.
I.R.
More than 10,000M
Ω or 500Ω ・F
(Whichever is smaller)
12 Vibration
Appearance
No defects or abnormalities
Solder the capacitor to the test jig (glass epoxy board) in the same
Capacitance
Within the specified tolerance
manner and under the same conditions as (19). The capacitor
Change
should be subjected to a simple harmonic motion having a total
Q/D.F.
30pFmin. : Q≧1000
R7/L8 : W.V.: 25Vmin.: 0.025 max.
amplitude of 1.5mm, the frequency being varied uniformly between
30pFmax.: Q ≧400+20C
W.V.: 16V/10V : 0.035 max.
the approximate limits of 10 and 2000Hz. The frequency range, from
C: Nominal Capacitance(pF)
R9 : 0.05max.
10 to 2000Hz and return to 10Hz, should be traversed in
approximately 20 minutes. This motion should be applied for 12
I.R.
More than 10,000M
Ω or 500Ω ・F
items in each 3 mutually perpendicular directions (total of 36 times).
(Whichever is smaller)
13 Resistance to
The measured and observed characteristics should satisfy the
Immerse the capacitor in a eutectic solder solution at 260±5℃ for
Soldering Heat
specifications in the following table.
10±1 seconds. Set at room temperature for 24±2 hours, then
Appearance
No marking defects
measure.
Capacitance
Within the specified tolerance
Change
・ Initial measurement for high dielectric constant type
Q/D.F.
30pFmin. : Q≧1000
R7/L8 : W.V.: 25Vmin.: 0.025 max.
Perform a heat treatment at 150+0/-10 ℃ for one hour and then set
30pFmax.: Q ≧400+20C
W.V.: 16V/10V : 0.035 max.
for 24±2 hours at room temperature.
C: Nominal Capacitance(pF)
R9 : 0.05max.
Perform the initial measurement.
I.R.
More than 10,000M
Ω or 500Ω ・F
(Whichever is smaller)
■AEC-Q200 Murata Standard Specification and Test Methods
No
AEC-Q200 Test Item
AEC-Q200 Test Method
Specification.
JEMCGS-0363S
3


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