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GCM21BR72A103KA37 Datasheet(PDF) 2 Page - Murata Manufacturing Co., Ltd. |
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GCM21BR72A103KA37 Datasheet(HTML) 2 Page - Murata Manufacturing Co., Ltd. |
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2 / 28 page  Temperature Compensating Type High Dielectric Type Pre-and Post-Stress Electrical Test 2 High Temperature The measured and observed characteristics should satisfy the Set the capacitor for 1000±12 hours at 150±3℃. Set for Exposure (Storage) specifications in the following table. 24±2 hours at room temperature, then measure. Appearance No marking defects Capacitance Within ±2.5% or ±0.25pF R7/L8/R9: Within ±10.0% Change (Whichever is larger) Q/D.F. 30pFmin. : Q≧1000 R7/L8 W.V.: 25Vmin.: 0.03 max. 30pFmax.: Q ≧400+20C W.V.: 16V/10V : 0.05 max. C: Nominal Capacitance(pF) R9 : 0.075max. I.R. More than 10,000M Ω or 500Ω ・F (Whichever is smaller) R9 : More than 150Ω ・F 3 Temperature Cycling The measured and observed characteristics should satisfy the Fix the capacitor to the supporting jig in the same manner and under specifications in the following table. the same conditions as (19). Perform cycle test according to the four Appearance No marking defects heat treatments listed in the following table. Set for 24±2 hours at Capacitance Within ±2.5% or ±0.25pF R7/L8/R9: Within ±10.0% room temperature, then measure Change (Whichever is larger) Q/D.F. 30pFmin. : Q≧1000 R7/L8 W.V.: 25Vmin.: 0.03 max. 30pFmax.: Q ≧400+20C W.V.: 16V/10V : 0.05 max. C: Nominal Capacitance(pF) R9 : 0.05max. I.R. More than 10,000M Ω or 500Ω ・F (Whichever is smaller) ・ Initial measurement for high dielectric constant type Perform a heat treatment at 150+0/-10 ℃ for one hour and then set for 24±2 hours at room temperature. Perform the initial measurement. 4 Destructive No defects or abnormalities Per EIA-469. Phisical Analysis 5 Moisture Resistance The measured and observed characteristics should satisfy the Apply the 24-hour heat (25 to 65℃) and humidity (80 to 98%) specifications in the following table. treatment shown below, 10 consecutive times. Appearance No marking defects Set for 24±2 hours at room temperature, then measure. Capacitance Within ±3.0% or ±0.30pF R7/L8/R9: Within ±12.5% Change (Whichever is larger) Q/D.F. 30pFmin. : Q≧350 R7/L8 : W.V.: 25Vmin.: 0.03 max. 10pF and over, 30pF and below: W.V.: 16V/10V : 0.05 max. Q≧275+5C/2 R9 : 0.075max. 10pFmax.: Q ≧200+10C C: Nominal Capacitance(pF) I.R. More than 10,000M Ω or 500Ω ・F (Whichever is smaller) R9 : More than 150 Ω ・F 6 Biased Humidity The measured and observed characteristics should satisfy the Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8kΩ resister) specifications in the following table. at 85±3℃ and 80 to 85% humidity for 1000±12 hours. Appearance No marking defects Remove and set for 24±2 hours at room temprature, then measure. Capacitance Within ±3.0% or ±0.30pF R7/L8/R9: Within ±12.5% The charge/discharge current is less than 50mA. Change (Whichever is larger) Q/D.F. 30pF and over: Q≧200 R7/L8 W.V.: 25Vmin.: 0.035 max. 30pF and below: Q≧100+10C/3 W.V.: 16V/10V : 0.05 max. C: Nominal Capacitance(pF) R9 : 0.075max. I.R. More than 1,000M Ω or 50Ω ・F (Whichever is smaller) ■AEC-Q200 Murata Standard Specification and Test Methods No AEC-Q200 Test Item AEC-Q200 Test Method Specification. 1 - Step Time(min) Cycles 1000(for ΔC/R7) 300(for 5G/L8/R9) 1 15±3 -55℃+0/-3 -55℃+0/-3 2 1 Room Room 3 15±3 125℃+3/-0 150℃+3/-0 4 1 Room Room One cycle 24hours Hours Initial measuremt +10 - 2 ℃ Humidity 90～98% Humidity 80～98% Humidity 80～98% Humidity 90～98% Humidity 90～98% 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 Temperature 70 65 60 55 50 45 40 35 30 25 20 15 10 5 0 -5 -10 (℃) JEMCGS-0363S 2 |
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