NB100LVEP56

http://onsemi.com

8

−40°C

25°C

85°C

Symbol

Characteristic

Min

Typ

Max

Min

Typ

Max

Min

Typ

Max

Unit

(See Figure 5)

600

550

400

750

650

550

600

500

350

750

600

450

600

400

200

750

500

300

mV

Propagation Delay to Output Differential

D to Q, Q

SEL to Q, Q

COM_SEL to Q, Q

375

575

550

500

775

750

625

975

950

400

625

600

525

825

800

650

1025

1000

450

700

700

575

900

900

700

1100

1100

ps

Pulse Skew (Note 30)

Within Device Input Skew (Note 31)

Within Device Output Skew (Note 32)

Device−to−Device Skew (Note 33)

5

15

20

50

50

30

50

200

5

15

20

50

50

30

50

200

5

15

20

50

50

30

50

200

ps

RMS Random Clock Jitter

(Note 34)

Peak−to−Peak Data Dependent Jitter

(Note 35)

5

15

1

10

25

1

10

20

1

ps

Input Voltage Swing (Differential Configuration)

(Note 36)

150

800

1200 150

800

1200 150

800

1200

mV

Output Rise/Fall Times @ 50 MHz

Q, Q

(20% − 80%)

60

110

150

60

120

170

90

140

230

ps

NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit

board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared

operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit

values are applied individually under normal operating conditions and not valid simultaneously.

31.Worst case difference between D0a and D0b (or between D1a or D1b), when both output come from same input.

32.Worst case difference between Q0 and Q1 outputs.

33.Skew is measured between outputs under identical transitions.

36.Input voltage swing is a single−ended measurement operating in differential mode.