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LM2432TE Datasheet(PDF) 3 Page - National Semiconductor (TI) |
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LM2432TE Datasheet(HTML) 3 Page - National Semiconductor (TI) |
3 / 13 page AC Test Circuit Figure 3 shows a typical test circuit for evaluation of the LM2432. This circuit was designed to test the transient response of the LM2432 in a 50 Ω environment without the use of an expensive FET probe. On the input side, a 50Ω pulse generator output can be AC coupled and biased with an external supply via the V ADJ input. On the output side, the two 4990 Ω resistors form a 400:1 divider with the 50 Ω resistor and the oscilloscope. A test point can be included for easy use of an oscilloscope probe. A compensation capacitor can be used to compensate the network to achieve a flat frequency response. 20137703 Note: 10pF load includes parasitic capacitance. FIGURE 3. Test Circuit www.national.com 3 |
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