NCV7240, NCV7240A, NCV7240B

www.onsemi.com

7

LHI = 0 V unless otherwise specified).

Characteristic

Unit

Max

Typ

Min

Conditions

OUTPUT TIMING SPECIFICATIONS

Serial Control

Output turn−on time

All Channels

CSB going high 80% to OUTx going low

−

30

50

ms

Serial Control

Output turn−off time

All Channels

CSB going high 80% to OUTx going high

−

30

50

ms

Parallel Control

Output turn−on time

All Channels

INx going high 80% to OUTx going low

−

30

50

ms

Parallel Control

Output turn−off time

All Channels

Inx going low 20% to OUTx going high

−

30

50

ms

Over Load Shut−Down Delay Time

3

15

50

ms

Open Load Detection Time

30

115

200

ms

DIGITAL INTERFACE CHARACTERISTICS

INPUT CHARACTERISTICS

Digital Input Threshold

(CSB, SI, SCLK, LHI, EN,INx)

0.8

1.4

2.0

V

Digital Input Hysteresis

(CSB, SI, SCLK, INx)

50

175

300

mV

Digital Input Hysteresis

(LHI, EN)

150

400

800

mV

Input Pulldown Resistance

(SI, SCLK, LHI, EN,INx)

Inx = SI = SCLK = LHI = EN = VDD

50

120

190

k

W

Input Pullup Resistance (CSB)

CSB = 0 V

50

120

190

k

W

CSB Leakage to VDD

CSB = 5 V, VDD = 0 V

−

−

100

uA

CSB Leakage to VDDA

CSB = 5 V, VDDA = 0 V

−

−

100

uA

OUTPUT CHARACTERISTICS

SO – Output High

I(out) = −1.5 mA

0.4

−

−

V

SO – Output Low

I(out) = 2.0 mA

−

−

0.6

V

SO Tri−state Leakage

CSB = VDD

−3

0

3

mA

SPI TIMING (all timing specifications measured at 20% and 80% voltage levels)

SCLK Frequency

−

−

5

MHz

SCLK Clock Period

200

−

−

ns

SCLK High Time

Figure 5, #1

85

−

−

ns

SCLK Low Time

Figure 5, #2

85

−

−

ns

SI Setup Time

Figure 5, #11

50

−

−

ns

SI Hold Time

Figure 5, #12

50

−

−

ns

CSB Setup Time

Figure 5, #5, 6

100

−

−

ns

CSB High Time

Figure 5, #7

1.5

−

−

ms

SCLK Setup Time

Figure 5, #3, 4

85

−

−

ns

SO Output Enable Time

(CSB falling to SO valid)

Not ATE tested

−

−

200

ns

SO Output Disable Time

(CSB rising to SO tri−state)

Figure 5, #9

Not ATE tested

−

−

200

ns

SO Output Data Valid Time with capacitive load

Not ATE tested

−

−

100

ns

Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product

performance may not be indicated by the Electrical Characteristics if operated under different conditions.