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NCP706MX21TAG Datasheet(PDF) 3 Page - ON Semiconductor |
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NCP706MX21TAG Datasheet(HTML) 3 Page - ON Semiconductor |
3 / 16 page NCP706 www.onsemi.com 3 ABSOLUTE MAXIMUM RATINGS Rating Symbol Value Unit Input Voltage (Note 1) VIN −0.3 V to 6 V V Output Voltage VOUT −0.3 V to VIN + 0.3 V V Enable Input VEN −0.3 V to VIN + 0.3 V V Output Short Circuit Duration tSC Indefinite s Maximum Junction Temperature TJ(MAX) 150 °C Storage Temperature TSTG −55 to 150 °C ESD Capability, Human Body Model (Note 2) ESDHBM 2000 V ESD Capability, Machine Model (Note 2) ESDMM 200 V Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. Refer to ELECTRICAL CHARACTERISTIS and APPLICATION INFORMATION for Safe Operating Area. 2. This device series incorporates ESD protection and is tested by the following methods: ESD Human Body Model tested per EIA/JESD22−A114 Latch−up Current Maximum Rating tested per JEDEC standard: JESD78 THERMAL CHARACTERISTICS Rating Symbol Value Unit Thermal Characteristics, XDFN8 1.6x1.2, 04P Thermal Resistance, Junction−to−Air RqJA 160 °C/W |
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