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CLC251-15150303H3-B038Z Datasheet(PDF) 9 Page - CITIZEN ELECTRONICS CO., LTD. |
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CLC251-15150303H3-B038Z Datasheet(HTML) 9 Page - CITIZEN ELECTRONICS CO., LTD. |
9 / 16 page Ref.CE-P3410 12/04 5. Reliability 5-1. Reliability Test 5-2. Failure Criteria 9 Test Item Test Condition Low Temperature Storage Test Ta=-40 C × 1000 hours Thermal Shock Test -30 C × 30 minutes – 85 C × 30 minutes , 100cycle Continuous Operation Test High Temperature Storage Test Ta=100 C × 1000 hours Moisture-proof Test Ta=60 C , 95% RH × 500 hours Vop = 230 V[RMS] Ta=25C ×1000 hours Vop= 230 V[RMS] Tj=150C × 1000 hours ( Tc=25C ) U defines the upper limit of the specified characteristics. S defines the initial value. Note : Measurement shall be taken between 2 hours and 24 hours, and the test pieces should be return to the normal ambient conditions after the completion of each test. Total Luminous Flux Φv Vop = 230 V[RMS] <S × 0.8 Measuring Item Symbol Measuring Condition Failure Criteria Forward Voltage Vf Vop = 230 V[RMS] >U × 1.2 |
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