ABSOLUTE MAXIMUM RATINGS

VIN

Input Voltage................................................. +18V, -0.3V

No Overload or Short..................................... +23V,-0.3V

Output Current......................................................... 3.0A

Set Pin Current ................................................... ±25mA

Set Pin Voltage....................................................... ±10V

(10 Seconds)............................................................300°C

MSK5986RH.......................................... -40°C to +85°C

MSK5986K/H RH................................. -55°C to +125°C

ESD Rating......................................................... CLASS 2

10

7

7

8

7

ELECTRICAL SPECIFICATIONS

Parameter

Test Conditions 1 11

Group A

Subgroup

MSK 5986K/H RH

MSK 5986RH

Units

Min.

Typ.

Max.

Min.

Typ.

Max.

Set Pin Current

1

49.5

50

50.5

49.5

50

50.5

uA

2, 3

49

-

51.5

-

-

-

uA

Post Radiation

1

49

-

51

49

-

51

uA

Output Offset Voltage

(VOS)

VIN = 3.0V VOUT = 1.0V

1

-4.5

0

4.5

-4.5

0

4.5

mV

2, 3

-6

-

6

-

-

-

mV

Load Regulation

(

-4

-

4

-4

-

4

mV

(

-300

-10

+300

-300

-10

+300

nA

Line Regulation

(

VOUT = 0V

(

1, 2, 3

-0.05

-

0.05

-0.05

-

0.05

mV/V

1, 2, 3

-10

0.1

+10

-10

0.1

+10

nA/V

Dropout Voltage

2

1%

1

-

1.47

-

-

1.47

-

V

10%

1

-

1.94

-

-

1.94

-

V

Current Limit

9

VIN = 5.0V

VOUT = 1.0V

1

2.8

3.4

-

2.8

3.4

-

A

2, 3

2.8

-

-

-

-

-

A

Minimum Load Current 6

VIN = 23V

-

-

-

1

-

-

1

mA

Ripple Rejection

2

F = 120Hz

-

-

85

-

-

85

-

dB

Output Noise

2

VIN = 3V

10Hz to 100KHz

-

-

40

-

-

40

-

Thermal Resistance

2

Junction to Case @ 125°C

-

-

1.5

1.9

-

1.5

1.9

°C/W

NOTES:

1

Output is decoupled to ground using a 220µF tantalum low ESR capacitor in parallel with 3 pieces of 1.0µF and one 0.1µF ceramic capacitor unless otherwise

specified. (See Figure 1)

2

Guaranteed by design but not tested. Typical parameters are representative of actual device performance but are for reference only.

3

Industrial grade devices shall be tested to subgroup 1 unless otherwise specified.

4

Class H and K devices shall be 100% tested to subgroups 1, 2 and 3.

5

Subgroup 1

2

3

6

Minimum load current verified while testing line regulation.

7

Voltage is measured with respect to VOUT.

8

Set pin is clamped to VOUT with diodes in series with 1KΩ resistors. Current will flow under transient conditions.

9

Reference current limit typical performance curve for output current capability versus voltage drop.

10

Continuous operation at or above absolute maximum ratings may adversely effect the device performance and/or life cycle.

11

Pre and Post irradiation limits at 25°C, up to 100 Krad(Si) TID, are identical unless otherwise specified.

2

8548-169 Rev. F 2/18