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FM21L16-60-TGTR Datasheet(PDF) 10 Page - Cypress Semiconductor |
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FM21L16-60-TGTR Datasheet(HTML) 10 Page - Cypress Semiconductor |
10 / 22 page FM21L16 Document Number: 001-86191 Rev. *D Page 10 of 22 AC Test Conditions Input pulse levels ...................................................0 V to 3 V Input rise and fall times (10%–90%) ........................... < 3 ns Input and output timing reference levels ....................... 1.5 V Output load capacitance............................................... 30 pF Data Retention and Endurance Parameter Description Test condition Min Max Unit TDR Data retention TA = 85 C 10 – Years TA = 75 C38 – TA = 65 C151 – NVC Endurance Over operating temperature 1014 – Cycles Capacitance Parameter Description Test Conditions Max Unit CI/O Input/Output capacitance (DQ) TA = 25 C, f = 1 MHz, VDD = VDD(Typ) 8 pF CIN Input capacitance 6pF CZZ Input capacitance of ZZ pin 8 pF Thermal Resistance Parameter Description Test Conditions 44-pin TSOP II Unit JA Thermal resistance (junction to ambient) Test conditions follow standard test methods and procedures for measuring thermal impedance, in accordance with EIA/JESD51. 102 C/W JC Thermal resistance (junction to case) 22 C/W |
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