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CS43L36 Datasheet(PDF) 12 Page - Cirrus Logic |
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CS43L36 Datasheet(HTML) 12 Page - Cirrus Logic |
12 / 89 page DS1081F3 12 CS43L36 3 Characteristics and Specifications 3 Characteristics and Specifications Table 3-1 defines parameters as they are characterized in this section. Table 3-1. Parameter Definitions Parameter Definition Dynamic range The ratio of the rms value of the signal to the rms sum of all other spectral components over the specified bandwidth. A signal-to-noise ratio measurement over the specified bandwidth made with a –60 dB signal; 60 dB is added to resulting measurement to refer the measurement to full scale. This technique ensures that distortion components are below the noise level and do not affect the measurement. This measurement technique has been accepted by the Audio Engineering Society, AES17–1991, and the Electronic Industries Association of Japan, EIAJ CP–307. Dynamic range is expressed in decibel units. Idle channel noise The rms value of the signal with no input applied (properly back-terminated analog input, digital zero, or zero modulation input). Measured over the specified bandwidth. Interchannel isolation A measure of cross talk between the left and right channel pairs. Interchannel isolation is measured for each channel at the converter's output with no signal to the input under test and a full-scale signal applied to the other channel. Interchannel isolation is expressed in decibel units. Load resistance and capacitance The recommended minimum resistance and maximum capacitance required for the internal op-amp's stability and signal integrity. The load capacitance effectively moves the band-limiting pole of the amp in the output stage. Increasing load capacitance beyond the recommended value can cause the internal op-amp to become unstable. Offset error The deviation of the midscale transition (111…111 to 000…000) from the ideal. Output offset voltage The DC offset voltage present at the amplifier’s output when its input signal is in a mute state. The offset exists due to CMOS process limitations and is proportional to analog volume settings. When measuring the offset out the headphone amplifier, the headphone amplifier is ON. Total harmonic distortion + noise (THD+N) The ratio of the rms sum of distortion and noise spectral components across the specified bandwidth (typically 20 Hz–20 kHz) relative to the rms value of the signal. THD+N is measured at –1 and –20 dBFS for the analog input and at 0 and –20 dB for the analog output, as suggested in AES17–1991 Annex A. THD+N is expressed in decibel units. Table 3-2. Recommended Operating Conditions Test conditions: GNDA = GNDL = GNDCP = 0 V; voltages are with respect to ground. Parameters Symbol Minimum 1 1.Device functional operation is guaranteed within these limits; operation outside them is not guaranteed or implied and may reduce device reliability. Maximum 1 Unit DC power supply Charge pump VCP 1.66 1.94 V LDO regulator for digital 2 2.If DIGLDO_PDN is deasserted, no external voltage must be applied to VD_FILT. DIGLDO_PDN = 0 and VL_SEL = 0 VD_FILT 1.10 1.30 V Serial interface control port DIGLDO_PDN = 0 and VL_SEL = 0 VL_SEL = 1 VL VL 1.10 1.66 1.30 1.94 V V Analog VA 1.66 1.94 V Battery supply VP 2.50 3 3.Although device operation is guaranteed down to 2.5 V, device performance is guaranteed only down to 3.0 V. The following are affected when VP < 3.0 V: charge pump LDO, TIP_SENSE threshold. 5.25 V External voltage applied to pin 4,5 4.The maximum over/undervoltage is limited by the input current. 5.Table 1-1 lists the power supply domain in which each CS43L36 pin resides. TIP_SENSE pin ±VCP_FILT domain pins 6 VL domain pins VA domain pins VP domain pins 6.±VCP_FILT is specified in Table 3-8. VINHI VVCPF VVL VVA VVP –VCP_FILT – 0.3 –VCP_FILT – 0.3 –0.3 –0.3 –0.3 VP + 0.3 +VCP_FILT + 0.3 VL + 0.3 VA + 0.3 VP + 0.3 V V V V V Ambient temperature TA –40 +85 C Table 3-3. Absolute Maximum Ratings Test conditions: GNDA = GNDL = GNDCP = 0 V; voltages are with respect to ground. Parameters Symbol Minimum Maximum Unit DC power supply Charge pump, LDO, serial/control, analog (see Section 4.9 ) Digital core Battery VL, VA, VCP VD_FILT VP –0.3 –0.3 –0.3 2.33 1.55 6.3 V V V Input current 1 1.Any pin except supply pins. Transient currents of up to ±100 mA on analog input pins do not cause SCR latch-up. Iin — ±10 mA Ambient operating temperature (power applied) TA –50 +115 °C Storage temperature Tstg –65 +150 °C Caution: Stresses beyond “Absolute Maximum Ratings” levels may cause permanent damage to the device. These levels are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in Table 3-2, “Recommended Operating Conditions” is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. |
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