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DS55451 Datasheet(PDF) 5 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part No. DS55451
Description  Dual Peripheral Drivers
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Maker  NSC [National Semiconductor (TI)]
Homepage  http://www.national.com
Logo NSC - National Semiconductor (TI)

DS55451 Datasheet(HTML) 5 Page - National Semiconductor (TI)

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DC Test Circuits
TLF5824 – 15
Both inputs are tested simultaneously
FIGURE 1 VIH VOL
TLF5824 – 16
Each input is tested separately
FIGURE 2 VIL VOH
TLF5824 – 17
Each input is tested separately
FIGURE 3 VI IIL
TLF5824 – 18
Each input is tested separately
FIGURE 4 II IIH
TLF5824 – 19
Each input is tested separately
FIGURE 5 IOS
TLF5824 – 20
Both gates are tested simultaneously
FIGURE 6 ICCH ICCL
TLF5824 – 21
Circuit
Under
Input
Test
Other
Input
Output
Apply
Measure
DS55451
VIH
VIH
VOH
IOH
VIL
VCC
IOL
VOL
DS55452
VIH
VIH
IOL
VOL
VIL
VCC
VOH
IOH
DS55453
VIH
Gnd
VOH
IOH
VIL
VIL
IOL
VOH
DS55454
VIH
Gnd
IOL
VOL
VIL
VIL
VOH
IOH
FIGURE 7 VIH VIL IOH VOL
Note A
Each input is tested separately
Note B
When testing DS55453DS75453
DS55454DS75454 input not
under test is grounded
For all other circuits it is at 45V
TLF5824 – 22
FIGURE 8 VI VIL
Each input is tested separately
TLF5824 – 23
FIGURE 9 II IIH
Both gates are tested simultaneously
TLF5824 – 24
FIGURE 10 ICCH ICCL for AND NAND Circuits
Both gates are tested simultaneously
TLF5824 – 25
FIGURE 11 ICCH ICCL for OR NOR Circuits
5


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