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CY7C1381KV33 Datasheet(PDF) 32 Page - Cypress Semiconductor |
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CY7C1381KV33 Datasheet(HTML) 32 Page - Cypress Semiconductor |
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32 / 34 page 
CY7C1381KV33/CY7C1381KVE33 CY7C1383KV33/CY7C1383KVE33 Document Number: 001-97888 Rev. *F Page 32 of 34 Acronyms Document Conventions Units of Measure Acronym Description CE Chip Enable CMOS Complementary Metal Oxide Semiconductor EIA Electronic Industries Alliance FBGA Fine-Pitch Ball Grid Array I/O Input/Output JEDEC Joint Electron Devices Engineering Council JTAG Joint Test Action Group LMBU Logical Multi-Bit Upsets LSB Least Significant Bit LSBU Logical Single-Bit Upsets MSB Most Significant Bit OE Output Enable SEL Single Event Latch Up SRAM Static Random Access Memory TAP Test Access Port TCK Test Clock TDI Test Data-In TDO Test Data-Out TMS Test Mode Select TQFP Thin Quad Flat Pack TTL Transistor-Transistor Logic Symbol Unit of Measure °C degree Celsius MHz megahertz µA microampere mA milliampere mm millimeter ms millisecond mV millivolt ns nanosecond ohm % percent pF picofarad Vvolt Wwatt |
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