V

A

AGND

To Internal Circuitry

I/O

11

ADC14155QML-SP

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SNAS378J – NOVEMBER 2008 – REVISED MARCH 2018

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(1)

Pre and post irradiation limits are identical to those listed in the Electrical Characteristics tables. Radiation testing is performed per MIL-

STD-883, Test Method 1019.

(2)

current is limited per Note 5. However, errors in the A/D conversion can occur if the input goes above 2.6 V or below GND as described

in the Recommended Operating Conditions section.

(3)

(4)

(5)

limited to ±5 mA. The ±50 mA maximum package input current rating limits the number of pins that can safely exceed the power

supplies with an input current of ±5 mA to 10.

(6)

specifications are not ensured.

(7)

Test at wafer sort only.

(8)

Specified by design.

(9)

Specified by characterization.

6.8 ADC14155 Converter Electrical Characteristics (Continued) Timing and AC

Characteristics

(1)

(2) (3) (4) (5)

PARAMETER

TEST CONDITIONS

NOTES

MIN

MAX

UNITS

SUB-

GROUPS

Maximum clock frequency

155

MHz

[7, 8A, 8B]

Minimum clock frequency

5

MHz

Clock high time

3.0

ns

Clock low time

3.0

ns

Conversion latency

8

Clock

cycles

Output delay of CLK to

DATA

Relative to falling edge of CLK

2.0

ns

Data output setup time

Relative to DRDY

2.1

1.22

ns

[9, 10, 11]

Data output hold time

Relative to DRDY

2.1

1.83

ns

[9, 10, 11]

Aperture delay

0.5

ns

Aperture jitter

0.08

ps rms

Power down recovery time

0.1 µF to GND on pins 43, 44;

10 µF and 0.1 µF between

pins 43, 44; 0.1 µF and 10 µF

to GND on pins 47, 48

3.0

ms